Microchip® Advanced Software Framework

This unit test carries out tests for TC driver.

The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.

This unit test carries out tests for the DAC driver.

This unit test carries out tests for SERCOM USART driver.

This unit test carries out tests for NVM driver.

This unit test carries out tests for the ADC driver.

This unit test carries out tests for the External Interrupt driver.

This unit test carries out tests for the FREQM driver.

This unit test carries out tests for the AC driver.

This unit test carries out tests for the I2C driver.

This unit test carries out tests for the RWW EEPROM Emulator service.

This unit test carries out tests for the EVENTS driver.

This unit test carries out tests for WDT driver.

This unit test carries out tests for TCC driver.

This unit test carries out tests for SERCOM SPI driver.

This unit test carries out tests for the RTC count driver.

This unit test carries out tests for the EEPROM Emulator service.

This unit test carries out tests for the RTC calendor driver.

It consists of test cases for the following functionalities:

• Test for RTC calendar initialization.
• Test for RTC calendar polled mode.
• Test for RTC calendar callback mode.

This unit test carries out tests for the EEPROM Emulator service.

It consists of test cases for the following functionalities:

• Test for EEPROM emulator initialization.
• Test for EEPROM emulator buffer read/write functionality.
• Test for EEPROM emulator page read/write functionality.

This unit test carries out tests for the RTC count driver.

It consists of test cases for the following functionalities:

• Test for RTC count initialization.
• Test for RTC count polled mode.
• Test for RTC count callback mode.

This unit test carries out tests for SERCOM SPI driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for single byte write and read by polling.
• Test for buffer write by polling and read with interrupt.
• Test for buffer read & write using transceive function.
• Test for 9-bit data transfer.
• Test for baudrate.

This unit test carries out tests for TCC driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for TCC start/stop
• Test for TCC callback generation
• Test for 24-bit TCC operation
• Test for compare and capture TCC operation

This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.

This unit test carries out tests for WDT driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for early warning callbacks.
• Test for system reset upon timeout.

This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.

This unit test carries out tests for the EVENTS driver.

It consists of test cases for the following functionalities:

• Test for synchronous event propagation.
• Test for resynchronized event propagation.
• Test for asynchronous event propagation.

This unit test carries out tests for the RWW EEPROM Emulator service.

It consists of test cases for the following functionalities:

• Test for RWW EEPROM emulator initialization.
• Test for RWW EEPROM emulator buffer read/write functionality.
• Test for RWW EEPROM emulator page read/write functionality.

This unit test carries out tests for the I2C driver.

It consists of test cases for the following functionalities:

• Test for I2C initialization.
• Test for I2C master transfer.
• Test for I2C master full speed transfer.

This unit test carries out tests for the AC driver.

It consists of test cases for the following functionalities:

• Test for AC initialization.
• Test for AC single shot comparison.
• Test for AC callback mode comparison.
• Test for AC continuous window mode comparison.

This unit test carries out tests for the FREQM driver.

It consists of test cases for the following functionalities:

• Test for FREQM polling mode read.
• Test for FREQM callback mode read.

This unit test carries out tests for the External Interrupt driver.

It consists of test cases for the following functionalities:

• Test for polled mode detection of external interrupt.
• Test for callback mode detection of external interrupt.

This unit test carries out tests for the ADC driver.

It consists of test cases for the following functionalities:

• Test for ADC initialization.
• Test for ADC polled mode conversion.
• Test for ADC callback mode conversion.
• Test for ADC averaging mode.
• Test for ADC window mode.

This unit test carries out tests for NVM driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for NVM parameter retrieval.
• Test for FLASH row erasure.
• Test for FLASH page read and write.
• Test for FLASH partial page update.

This unit test carries out tests for SERCOM USART driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for single 8-bit write and read by polling.
• Test for single 9-bit write and read by polling.
• Test for multiple 8-bit write by polling and read by interrupts.
• Test for multiple 8-bit write and read by interrupts.

This unit test carries out tests for the DAC driver.

DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:

• Test for DAC initialization.
• Test for DAC buffer empty

The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.

It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.

ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.

This document describes the API interfaces to the low level ASF module drivers of the device.

For more information on ASF refer to the online documentation at www.atmel.com/asf.

This application demonstrates a simple example to toggle the board LED.

This unit test carries out tests for TC driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for TC start/stop
• Test for TC callback generation
• Test for 32-bit (chained) TC operation
• Test for compare and capture TC operation

This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.