Unit Tests

Introduction

This documentation has been automatically generated, and documents the source code found in the Microchip Advanced Software Framework (ASF).

Unit-tests

	AT45DBX DataFlash unit tests for EVK1100
	AT45DBX DataFlash unit tests for EVK1105
	Basic clock service unit tests for EVK1100
	Basic clock service unit tests for EVK1105
	FIFO service unit tests on for for EVK1105
	FIFO service unit tests on for EVK1100
	SD/MMC card example for EVK1100
	SD/MMC card example for EVK1105
	SD/MMC using SPI Unit Tests for EVK1100
	SD/MMC using SPI Unit Tests for EVK1105
	Unit tests for mt48LC16m16a2tg7 SDRAM component on EVK1100
	Unit tests for mt48LC16m16a2tg7 SDRAM component on EVK1105
	USB Device CDC unit tests for evk1100
	USB Device CDC unit tests for evk1105
	USB Device HID Mouse unit tests for evk1100
	USB Device HID Mouse unit tests for evk1100
	USB Device HID Mouse unit tests for evk1105
	USB Device HID Mouse unit tests for evk1105
	USB Device Mass Storage unit tests for evk1100
	USB Device Mass Storage unit tests for evk1105
	USB Host core tests on evk1100