Introduction

This documentation has been automatically generated, and documents the source code found in the Microchip Advanced Software Framework (ASF).

Unit-tests

	AT45DBX DataFlash unit tests for EVK1104
	Basic clock service unit tests for EVK1104
	NAND Flash component unit Test for EVK1104
	SD/MMC card example for EVK1104
	Unit Tests for IEEE 802.15.4 MAC AT86RF212 - RZ600
	Unit Tests for IEEE 802.15.4 MAC AT86RF231 - RZ600
	Unit tests for mt48LC16m16a2tg7 SDRAM component on EVK1104
	Unit Tests for RF4Control AT86RF212 - RZ600
	Unit Tests for RF4Control AT86RF231 - RZ600
	Unit Tests for the UC3 AT86RF212-RZ600
	Unit Tests for the UC3 AT86RF230B-RZ600
	Unit Tests for the UC3 AT86RF231-RZ600
	Unit Tests for Transceiver Abstraction Layer(TAL) AT86RF212 - RZ600
	Unit Tests for Transceiver Abstraction Layer(TAL) AT86RF231 - RZ600
	Unit Tests for Transceiver Feature Access(TFA) AT86RF212 - RZ600
	Unit Tests for Transceiver Feature Access(TFA) AT86RF231 - RZ600
	USB Device CDC unit tests for evk1104
	USB Device HID Mouse unit tests for evk1104
	USB Device HID Mouse unit tests for evk1104
	USB Device Mass Storage unit tests for evk1104
	USB Host core tests on evk1104