Unit Tests of the SD/MMC SPI Component.

#include <stdint.h>
#include <stdbool.h>
#include <asf.h>
#include <string.h>
#include "sd_mmc_spi.h"
#include "conf_test.h"

Macros
Byte pattern generator
#define	BYTE_PATTERN1(x) ((uint8_t) (((x) * 5 + 1) & 0xff))
	Generates byte pattern 1 for a given address. More...

#define	BYTE_PATTERN2(x) ((uint8_t) (((x) * 3) & 0xff))
	Generates byte pattern 2 for a given address. More...

Functions
int	main (void)
	Run SD/MMC SPI component unit tests. More...

static void	run_check_presence_test (const struct test_case *test)
	Checks the presence of the SD/MMC card. More...

static void	run_memory_check_test (const struct test_case *test)
	Performs a memory initialization on the SD/MMC card. More...

static void	run_multiple_sector_access_test (const struct test_case *test)
	Test the read and write multiple sector operations on the SD/MMC card. More...

static void	run_sector_access_test (const struct test_case *test)
	Test the read and write sector operations on the SD/MMC card. More...

void	sd_mmc_spi_read_multiple_sector_callback (const void *psector)

void	sd_mmc_spi_write_multiple_sector_callback (void *psector)

Variables
static uint32_t	cur_sector = 0
	Index of the current sector being processed. More...

static struct test_case *	cur_test
	Test case pointer used to refer to the current test case in the function sd_mmc_spi_read_multiple_sector_callback. More...

static uint8_t	sector_buf [MMC_SECTOR_SIZE]
	A SD/MMC sector-sized buffer for processing data in ram memory. More...

#define BYTE_PATTERN1 ( x ) ((uint8_t) (((x) * 5 + 1) & 0xff))

Generates byte pattern 1 for a given address.

Referenced by run_sector_access_test().

#define BYTE_PATTERN2 ( x ) ((uint8_t) (((x) * 3) & 0xff))

Generates byte pattern 2 for a given address.

Referenced by sd_mmc_spi_read_multiple_sector_callback(), and sd_mmc_spi_write_multiple_sector_callback().

int main ( void )

Run SD/MMC SPI component unit tests.

Initializes the clock system, board, serial output and SD/MMC card, then sets up the SD/MMC SPI unit test suite and runs it.

References usart_options_t::baudrate, board_init(), CONF_TEST_BAUDRATE, CONF_TEST_CHARLENGTH, CONF_TEST_PARITY, CONF_TEST_STOPBITS, CONF_TEST_USART, DEFINE_TEST_ARRAY, DEFINE_TEST_CASE, DEFINE_TEST_SUITE, run_check_presence_test(), run_memory_check_test(), run_multiple_sector_access_test(), run_sector_access_test(), sd_mmc_spi_board_init(), stdio_serial_init(), sysclk_init(), and test_suite_run().

static void run_check_presence_test ( const struct test_case * test )

static

Checks the presence of the SD/MMC card.

This function will simply test the output of the function sd_mmc_spi_check_presence and returns an error in case of failure.

Parameters

test	Current test case.

References sd_mmc_spi_check_presence(), and test_assert_true.

Referenced by main().

static void run_memory_check_test ( const struct test_case * test )

static

Performs a memory initialization on the SD/MMC card.

This function will simply test the output of the function sd_mmc_spi_mem_check and returns an error in case of failure.

Parameters

test	Current test case.

References sd_mmc_spi_mem_check(), and test_assert_true.

Referenced by main().

static void run_multiple_sector_access_test ( const struct test_case * test )

static

Test the read and write multiple sector operations on the SD/MMC card.

This function will test the read and write functionalities of the SD/MMC SPI component using multiple sector access. It will first fill the CONF_TEST_NB_SECTORS last sectors with a known pattern and read it back to test each value.

Parameters

test	Current test case.

References CONF_TEST_NB_SECTORS, cur_sector, sd_mmc_spi_get_capacity(), sd_mmc_spi_last_block_address, sd_mmc_spi_read_close(), sd_mmc_spi_read_multiple_sector(), sd_mmc_spi_read_open(), sd_mmc_spi_write_close(), sd_mmc_spi_write_multiple_sector(), sd_mmc_spi_write_open(), and test_assert_true.

Referenced by main().

static void run_sector_access_test ( const struct test_case * test )

static

Test the read and write sector operations on the SD/MMC card.

This function will test the read and write functionalities of the SD/MMC SPI component using sector access. It will first fill the last sector of the device with a known pattern and read it back by testing each value read.

Parameters