Unit tests for mt48LC16m16a2tg7 SDRAM component on UC3C_EK Documentation

Introduction

This is the unit test application for the MT48LC16m16a2tg7 SDRAM component. In essence, it tests that the EBI has been correctly set up by employing test for data integrity issues.

Main Files

• unit_tests.c
• common_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h

Device Info

All AVR UC3 devices can be used. This example has been tested with the following setup:

• evk1100
• evk1104
• evk1105
• uc3c_ek

Compilation info

This software was written for the GNU GCC and IAR for AVR. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.