AT45DBX DataFlash unit tests for Xplain Documentation

Introduction

This is the unit test application for the AT45dbx component. It consists of test cases for the following:

• Memory check
• Read/write byte access and data integrity
• Read/write sector access and data integrity
• Read/write multiple sector access and data integrity

Main Files

• unit_tests.c: AT45DBx memory unit tests application.
• at45dbx.c: The DataFlash driver
• at45dbx.h: The DataFlash driver header
• conf_test.h: test configuration file
• conf_board.h: board initialization process configuration
• conf_clock.h: clock specific initialization
• conf_at45dbx.h: DataFlash driver configuration (including SPI service selection)
• conf_usart_serial.h: Serial port configuration (

  See Also

  conf_test.h)

Device Info

All AVR devices can be used. This application has been tested with the following setup:

• Evaluation kits with a DataFlash connected to an SPI interface.

Compilation Info

This software was written for the GNU GCC and IAR for AVR. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.