Basic clock service unit tests for SAM4L-EK Documentation

Introduction

This is the unit test application for the Common Clock service. It consists of test cases for the following:

• Oscillator 0/1 test
• 32KHz Oscillator test
• Pll and Dfll test
• Synchronous clock test
• Generic clock test

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h

Device Info

All AVR and SAM4L devices can be used. This example has been tested with the following setup:

• EVK1100
• EVK1101
• EVK1104
• EVK1105
• UC3C_EK
• UC3L_EK
• STK600+RCUC3D
• SAM4L-EK
• SAM4L Xplained Pro Board.
• SAM4L8 Xplained Pro Board.

Description of the unit tests

See the documentation for the individual unit test functions here for detailed descriptions of the tests.

Dependencies

This example depends directly on the following modules:

• Test Suite Framework
• Common Clock service

Compilation info

This software was written for the GNU GCC and IAR for AVR. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.
Support and FAQ: https://www.microchip.com/support/