Calendar service unit tests on Xplain Documentation

Introduction

This is the unit test application for the Calendar service. It consists of test cases for the following:

• convert timestamp to date
• convert date to timestamp
• compute time between two dates
• increment date with one second

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h

Device Info

All AVR devices can be used. This example has been tested with the following setup:

• Xplain
• UC3-L0 Xplained
• STK600 with RCUC3D extension board

Description of the unit tests

See the documentation for the individual unit test functions here for detailed descriptions of the tests.

Dependencies

This example depends directly on the following modules:

• Test Suite Framework
• Calendar service

Compilation info

This software was written for the GNU GCC and IAR for AVR. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.
Support and FAQ: https://www.microchip.com/support/