EIC unit Test for SAM4L Documentation

Introduction

This is the unit test application for the EIC driver. It consists of test cases for the following functionality:

• Using GPIO as EIC pin to generate interrupt

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h

Device Info

The SAM4L devices can be used. This example has been tested with the following setup:

• Connect Pin PA06 and PB05

Compilation info

This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.
Support and FAQ: https://www.microchip.com/support/