PARC unit test configuration.
Copyright (c) 2014-2018 Microchip Technology Inc. and its subsidiaries.
Macros | |
#define | DATA_MASK 0xDF |
#define | PIN_PCCK PIN_PA06 |
Functions | |
static void | parc_port_source_simulation_config (void) |
static void | place_data_to_port (uint32_t data) |
Place data (a byte) on GPIO port. More... | |
#define DATA_MASK 0xDF |
Referenced by run_parc_callback_test(), and run_parc_polled_test().
#define PIN_PCCK PIN_PA06 |
Referenced by parc_port_input_simulation().
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inlinestatic |
References IOPORT_DIR_OUTPUT, IOPORT_PIN_LEVEL_HIGH, ioport_set_pin_dir(), and ioport_set_pin_level().
Referenced by main().
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inlinestatic |
Place data (a byte) on GPIO port.
data | GPIO output simulation data for PARC capture. |
References IOPORT_PIN_LEVEL_HIGH, IOPORT_PIN_LEVEL_LOW, and ioport_set_pin_level().
Referenced by parc_port_input_simulation().