SPI unit Test for SAM4L8 Xplained Pro Documentation

Introduction

This is the unit test application for the SPI driver. It consists of test cases for the following functionalities:

• SPI Reset/Enable/Disable
• SPI Tx/Rx (loopback)
• SPI DataFlash operations (if there is DataFlash on board)
• SPI Write Protection

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h

Device Info

All SAM devices can be used. This example has been tested with the following setup:

• sam3n4c_sam3n_ek
• sam3s4c_sam3s_ek
• sam3sd8c_sam3s_ek2
• sam3u4e_sam3u_ek
• sam3x8h_sam3x_ek
• sam4s16c_sam4s_ek
• sam4sd32c_sam4s_ek2
• sam4e16e_sam4e_ek
• sam4lc4c_sam4l_ek
• sam4lc4c_sam4l_xplained_pro
• sam4lc8c_sam4l8_xplained_pro
• sam4n16c_sam4n_xplained_pro
• sam4c16c_sam4c_ek
• sam4cp16b_sam4cp16bmb
• sam4cmp16c_sam4cmp_db
• sam4cms16c_sam4cms_db

Compilation info

This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.
Support and FAQ: https://www.microchip.com/support/