SSC unit Test for SAM4S Xplained Documentation

Introduction

This is the unit test application for the SSC driver. It tests SSC module in the loop mode, in this case, RD is connected to TD, RF isconnected to TF and RK is connected to TK.

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_uart_serial.h

Device Info

This example has been tested with the following setup:

• sam3s4c_sam3s_ek
• sam3sd8c_sam3s_ek2
• sam3u4e_sam3u_ek
• sam3x8h_sam3x_ek
• sam4s16c_sam4s_ek
• sam4s16c_sam4s_xplained
• sam4sd32c_sam4s_ek2
• samv71q21_samv71_xplained_ultra
• same70q21_same70_xplained_pro

Compilation info

This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.
Support and FAQ: https://www.microchip.com/support/