SUPC unit Test for SAM4S Xplained Documentation

Introduction

This is the unit test application for the SUPC driver. It consists of test cases for the following functionality:

• Slow clock source switching

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h

Device Info

All SAM devices can be used. This example has been tested with the following setup:

• sam3n4c_sam3n_ek
• sam3s4c_sam3s_ek
• sam3sd8c_sam3s_ek2
• sam3u4e_sam3u_ek
• sam3x8h_sam3x_ek
• sam4s16c_sam4s_ek
• sam4sd32c_sam4s_ek2
• sam4sd32c_atpl230amb
• sam4n16c_sam4n_xplained_pro
• sam4c16c_sam4c_ek
• sam4cp16b_sam4cp16bmb
• sam4cmp16c_sam4cmp_db
• sam4cms16c_sam4cms_db
• samv71q21_samv71_xplained_ultra

Compilation info

This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.
Support and FAQ: https://www.microchip.com/support/