TRNG unit Test for SAME70 Documentation

Introduction

This is the unit test application for the TRNG driver. It consists of test cases for the following functionality:

• TRNG new random value generate interrupt

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h

Device Info

SAM3/4 devices can be used. This example has been tested with the following setup:

• sam3x8h_sam3x_ek
• sam4c16c_sam4c_ek
• sam4cp16b_sam4cp16bmb
• sam4cmp16c_sam4cmp_db
• sam4cms16c_sam4cms_db
• same70q21_same70_xplained_pro
• samv71q21_samv71_xplained_ultra

Compilation info

This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.
Support and FAQ: https://www.microchip.com/support/