Flash EFC unit Test for SAM4S Xplained Documentation

Introduction

This is the unit test application for the flash efc driver. It consists of test cases for the following functionalities:

• Get flash device id
• Flash configure
• Get flash region information
• Flash write
• Flash lock
• Flash gpnvm utilities
• For sam3sd8, an additional erase test will be performed.

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h

Device Info

All SAM devices can be used. This example has been tested with the following setup:

• sam3n4c_sam3n_ek
• sam3s4c_sam3s_ek
• sam3sd8c_sam3s_ek2
• sam3u4e_sam3u_ek
• sam3x8h_sam3x_ek
• sam4s16c_sam4s_ek
• sam4sd32c_sam4s_ek2
• sam4e16e_sam4e_ek
• sam4n16c_sam4n_xplained_pro
• sam4c16c_sam4c_ek
• sam4cp16b_sam4cp16bmb
• sam4cmp16c_sam4cmp_db
• sam4cms16c_sam4cms_db
• samv71q21_samv71_xplained_ultra
• same70q21_same70_xplained_pro

Compilation info

This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.
Support and FAQ: https://www.microchip.com/support/