SAM ADC Unit Test

Overview:

• Introduction
• Setup
• Usage
• Compilation Info
• Contact Information

Introduction

This unit test carries out tests for the ADC driver.

It consists of test cases for the following functionalities:

• Test for ADC initialization.
• Test for ADC polled mode conversion.
• Test for ADC callback mode conversion.
• Test for ADC averaging mode.
• Test for ADC window mode.

Input to the ADC is provided with the DAC module.

The following kit is required for carrying out the test:

• SAM D20 Xplained Pro board
• SAM D21 Xplained Pro board
• SAM L21 Xplained Pro board
• SAM DA1 Xplained Pro board
• SAM C21 Xplained Pro board

Setup

The following connections has to be made using wires:

• SAM D21/L21/C21/D20 Xplained Pro
  • DAC VOUT (PA02) <--—> ADC4 (PA04)

To run the test:

• Connect the supported Xplained Pro board to the computer using a micro USB cable.
• Open the virtual COM port in a terminal application.

  Note

  The USB composite firmware running on the Embedded Debugger (EDBG) will enumerate as debugger, virtual COM port and EDBG data gateway.

• Build the project, program the target and run the application. The terminal shows the results of the unit test.

Usage

• The unit test configures DAC module to provide voltage to the ADC input.
• DAC output is adjusted to generate various voltages which are measured by the ADC.
• Different modes of the ADC are tested.

Compilation Info

This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.

Contact Information

For further information, visit http://www.microchip.com.