SAM I2S Unit Test

Overview:

• Introduction
• Setup
• Usage
• Compilation Info
• Contact Information

Introduction

This unit test carries out tests for the I²S driver.

It consists of test cases for the following functionalities:

• Test for polled mode transmit/receive of I²S.
• Test for callback mode transmit/receive of I²S.

Tests will be performed for data transmitting and receiving of I²S.

The following kit is required for carrying out the test:

• SAM D21 Xplained Pro board
• SAM DA1 Xplained Pro board

Setup

The following connections has to be made using wires:

• SAM D21/DA1 Xplained Pro
  • EXT2 Pin 3 (PA10, SCK0) <--—> EXT3 Pin 13 (PB11, SCK1)
  • EXT2 Pin 4 (PA11, FS0) <--—> Pin 7 (PB12, FS1)

To run the test:

• Connect the board to the computer using a micro USB cable.
• Open the virtual COM port in a terminal application.

  Note

  The USB composite firmware running on the Embedded Debugger (EDBG) will enumerate as debugger, virtual COM port and EDBG data gateway.

• Build the project, program the target and run the application. The terminal shows the results of the unit test.

Usage

• The unit test configures Clock Unit 0 to generate SCK and FS and Clock Unit 1 to use the signals.
• The unit test configures Serializer 0 to transmit data and Serializer 1 to receive data, over control signals received by Clock Unit 1.
• The test is again and with callback disabled.

Compilation Info

This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.

Contact Information

For further information, visit http://www.microchip.com.