SAM NVM Unit Test

Overview:

• Introduction
• Setup
• Usage
• Compilation Info
• Contact Information

Introduction

This unit test carries out tests for NVM driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for NVM parameter retrieval.
• Test for FLASH row erasure.
• Test for FLASH page read and write.
• Test for FLASH partial page update.

The following kit can be used for carrying out the test:

• SAM D20 Xplained Pro board
• SAM D21 Xplained Pro board
• SAM R21 Xplained Pro board
• SAM L21 Xplained Pro board
• SAM L22 Xplained Pro board
• SAM DA1 Xplained Pro board
• SAM HA1G16A Xplained Pro board
• SAM R30 Xplained Pro board
• SAM R30 Module Xplained Pro board
• SAM R34 Xplained Pro board
• WLR 089 Xplained Pro board

Setup

The following connections has to be made using wires:

• None

To run the test:

• Connect the SAM Xplained Pro board to the computer using a micro USB cable.
• Open the virtual COM port in a terminal application.

  Note

  The USB composite firmware running on the Embedded Debugger (EDBG) will enumerate as debugger, virtual COM port and EDBG data gateway.

• Build the project, program the target and run the application. The terminal shows the results of the unit test.

Usage

• The unit tests are carried out using the internal NVM controller.

Compilation Info

This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.

Contact Information

For further information, visit http://www.microchip.com.