Microchip® Advanced Software Framework

SAM RTC Unit Test

Overview:

Introduction

This unit test carries out tests for the RTC calendor driver.

It consists of test cases for the following functionalities:

  • Test for RTC calendar initialization.
  • Test for RTC calendar polled mode.
  • Test for RTC calendar callback mode.

The following kit is required for carrying out the test:

  • SAM D21 Xplained Pro board
  • SAM L21 Xplained Pro board
  • SAM L22 Xplained Pro board
  • SAM L22 Xplained Pro B board
  • SAM R21 Xplained Pro board
  • SAM DA1 Xplained Pro board
  • SAM C21 Xplained Pro board
  • SAM D20 Xplained Pro board
  • SAM R30 Xplained Pro board
  • SAM R30 Module Xplained Pro board
  • SAM R34 Xplained Pro board
  • WLR 089 Xplained Pro board

Setup

To run the test:

  • Connect the supported Xplained Pro board to the computer using a micro USB cable.
  • Open the virtual COM port in a terminal application.
    Note
    The USB composite firmware running on the Embedded Debugger (EDBG) will enumerate as debugger, virtual COM port and EDBG data gateway.
  • Build the project, program the target and run the application. The terminal shows the results of the unit test.

Usage

  • Different modes of the RTC are tested.

Compilation Info

This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.

Contact Information

For further information, visit http://www.microchip.com.