conf_test.h File Reference

SAM L21 Xplained Pro test configuration.

Copyright (c) 2014-2018 Microchip Technology Inc. and its subsidiaries.

Macros
#define	CONF_CAPTURE_CHAN_0   0
#define	CONF_CAPTURE_CHAN_1   1
#define	CONF_EIC_CHAN   4
#define	CONF_EIC_MUX   MUX_PB04A_EIC_EXTINT4
#define	CONF_EIC_PIN   PIN_PB04A_EIC_EXTINT4
#define	CONF_EVENT_GENERATOR_ID   EVSYS_ID_GEN_EIC_EXTINT_4
#define	CONF_EVENT_USED_ID   EVSYS_ID_USER_TCC1_EV_1
#define	CONF_EVENT_USER_ID_FAULTn   EVSYS_ID_USER_TCC0_MC_0
#define	CONF_EVENT_USER_ID_FAULTx   EVSYS_ID_USER_TCC0_EV_0
#define	CONF_STDIO_BAUDRATE   38400
#define	CONF_STDIO_MUX_SETTING   EDBG_CDC_SERCOM_MUX_SETTING
#define	CONF_STDIO_PINMUX_PAD0   EDBG_CDC_SERCOM_PINMUX_PAD0
#define	CONF_STDIO_PINMUX_PAD1   EDBG_CDC_SERCOM_PINMUX_PAD1
#define	CONF_STDIO_PINMUX_PAD2   EDBG_CDC_SERCOM_PINMUX_PAD2
#define	CONF_STDIO_PINMUX_PAD3   EDBG_CDC_SERCOM_PINMUX_PAD3
#define	CONF_STDIO_USART   EDBG_CDC_MODULE
#define	CONF_TEST_PIN_MUX   MUX_PB30E_TCC0_WO0
#define	CONF_TEST_PIN_OUT   PIN_PB30E_TCC0_WO0
#define	CONF_TEST_TCC0   TCC0
#define	CONF_TEST_TCC1   TCC1
#define	CONF_TEST_TOLERANCE   10

#define CONF_CAPTURE_CHAN_0   0

Referenced by run_capture_and_compare_test().

#define CONF_CAPTURE_CHAN_1   1

Referenced by run_capture_and_compare_test().

#define CONF_EIC_CHAN   4

Referenced by run_capture_and_compare_test(), run_faultn_test(), and run_faultx_test().

#define CONF_EIC_MUX   MUX_PB04A_EIC_EXTINT4

Referenced by run_capture_and_compare_test(), run_faultn_test(), and run_faultx_test().

#define CONF_EIC_PIN   PIN_PB04A_EIC_EXTINT4

Referenced by run_capture_and_compare_test(), run_faultn_test(), and run_faultx_test().

#define CONF_EVENT_GENERATOR_ID   EVSYS_ID_GEN_EIC_EXTINT_4

Referenced by run_capture_and_compare_test(), run_faultn_test(), and run_faultx_test().

#define CONF_EVENT_USED_ID   EVSYS_ID_USER_TCC1_EV_1

Referenced by run_capture_and_compare_test().

#define CONF_EVENT_USER_ID_FAULTn   EVSYS_ID_USER_TCC0_MC_0

Referenced by run_faultn_test().

#define CONF_EVENT_USER_ID_FAULTx   EVSYS_ID_USER_TCC0_EV_0

Referenced by run_faultx_test().

#define CONF_STDIO_BAUDRATE   38400

Referenced by cdc_uart_init().

#define CONF_STDIO_MUX_SETTING   EDBG_CDC_SERCOM_MUX_SETTING

Referenced by cdc_uart_init().

#define CONF_STDIO_PINMUX_PAD0   EDBG_CDC_SERCOM_PINMUX_PAD0

Referenced by cdc_uart_init().

#define CONF_STDIO_PINMUX_PAD1   EDBG_CDC_SERCOM_PINMUX_PAD1

Referenced by cdc_uart_init().

#define CONF_STDIO_PINMUX_PAD2   EDBG_CDC_SERCOM_PINMUX_PAD2

Referenced by cdc_uart_init().

#define CONF_STDIO_PINMUX_PAD3   EDBG_CDC_SERCOM_PINMUX_PAD3

Referenced by cdc_uart_init().

#define CONF_STDIO_USART   EDBG_CDC_MODULE

Referenced by cdc_uart_init().

#define CONF_TEST_PIN_MUX   MUX_PB30E_TCC0_WO0

Referenced by run_capture_and_compare_test().

#define CONF_TEST_PIN_OUT   PIN_PB30E_TCC0_WO0

Referenced by run_capture_and_compare_test(), run_faultn_test(), and run_faultx_test().

#define CONF_TEST_TCC0   TCC0

Referenced by run_basic_functionality_test(), run_callback_test(), run_capture_and_compare_test(), run_faultn_test(), run_faultx_test(), run_init_test(), and run_reset_test().

#define CONF_TEST_TCC1   TCC1

Referenced by run_capture_and_compare_test(), and run_init_test().

#define CONF_TEST_TOLERANCE   10

Referenced by run_capture_and_compare_test().