Unit Tests

Introduction

This documentation has been automatically generated, and documents the source code found in the Microchip Advanced Software Framework (ASF).

Unit-tests

	Unit Tests for the SAM D21 AC driver
	Unit Tests for the SAM D21 ADC Driver
	Unit Tests for the SAM D21 EEPROM emulator service
	Unit Tests for the SAM D21 Event system driver
	Unit Tests for the SAM D21 External Interrupt Driver
	Unit Tests for the SAM D21 I2C Driver
	Unit Tests for the SAM D21 I2S Driver
	Unit Tests for the SAM D21 NVM Driver
	Unit Tests for the SAM D21 RTC calendar Driver
	Unit Tests for the SAM D21 RTC Driver
	Unit Tests for the SAM D21 SPI Driver
	Unit Tests for the SAM D21 TC Driver
	Unit Tests for the SAM D21 TCC Driver
	Unit Tests for the SAM D21 USART Driver
	Unit Tests for the SAM D21 WDT Driver
	USB Device CDC unit tests for SAM D21 Xplained Pro
	USB Device HID Keyboard unit tests for SAM D21 Xplained Pro
	USB Device HID Mouse unit tests for SAM D21 Xplained Pro
	USB Device Mass Storage unit tests for SAM D21 Xplained Pro