Microchip® Advanced Software Framework

This unit test carries out tests for TC driver.

This unit test carries out tests for WDT driver.

This unit test carries out tests for the EVENTS driver.

This unit test carries out tests for TCC driver.

This unit test carries out tests for SERCOM USART driver.

This unit test carries out tests for NVM driver.

This unit test carries out tests for the RTC count driver.

This unit test carries out tests for SERCOM SPI driver.

This unit test carries out tests for the RWW EEPROM Emulator service.

This unit test carries out tests for the I2C driver.

This unit test carries out tests for the RTC calendor driver.

This unit test carries out tests for the EEPROM Emulator service.

This unit test carries out tests for the External Interrupt driver.

It consists of test cases for the following functionalities:

• Test for polled mode detection of external interrupt.
• Test for callback mode detection of external interrupt.

This example demonstrates different sleep modes, performance level and power gating feature.

This unit test carries out tests for the EEPROM Emulator service.

It consists of test cases for the following functionalities:

• Test for EEPROM emulator initialization.
• Test for EEPROM emulator buffer read/write functionality.
• Test for EEPROM emulator page read/write functionality.

This unit test carries out tests for the RTC calendor driver.

It consists of test cases for the following functionalities:

• Test for RTC calendar initialization.
• Test for RTC calendar polled mode.
• Test for RTC calendar callback mode.

This unit test carries out tests for the I2C driver.

It consists of test cases for the following functionalities:

• Test for I2C initialization.
• Test for I2C master transfer.
• Test for I2C master full speed transfer.

This unit test carries out tests for the RWW EEPROM Emulator service.

It consists of test cases for the following functionalities:

• Test for RWW EEPROM emulator initialization.
• Test for RWW EEPROM emulator buffer read/write functionality.
• Test for RWW EEPROM emulator page read/write functionality.

This unit test carries out tests for SERCOM SPI driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for single byte write and read by polling.
• Test for buffer write by polling and read with interrupt.
• Test for buffer read & write using transceive function.
• Test for 9-bit data transfer.
• Test for baudrate.

This unit test carries out tests for the RTC count driver.

It consists of test cases for the following functionalities:

• Test for RTC count initialization.
• Test for RTC count polled mode.
• Test for RTC count callback mode.

This unit test carries out tests for NVM driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for NVM parameter retrieval.
• Test for FLASH row erasure.
• Test for FLASH page read and write.
• Test for FLASH partial page update.

This unit test carries out tests for SERCOM USART driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for single 8-bit write and read by polling.
• Test for single 9-bit write and read by polling.
• Test for multiple 8-bit write by polling and read by interrupts.
• Test for multiple 8-bit write and read by interrupts.

This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.

This unit test carries out tests for TCC driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for TCC start/stop
• Test for TCC callback generation
• Test for 24-bit TCC operation
• Test for compare and capture TCC operation

This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.

This unit test carries out tests for the EVENTS driver.

It consists of test cases for the following functionalities:

• Test for synchronous event propagation.
• Test for resynchronized event propagation.
• Test for asynchronous event propagation.

This application demonstrates a simple example to toggle the board LED.

This unit test carries out tests for WDT driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for early warning callbacks.
• Test for system reset upon timeout.

This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.

This unit test carries out tests for TC driver.

It consists of test cases for the following functionalities:

• Test for driver initialization.
• Test for TC start/stop
• Test for TC callback generation
• Test for 32-bit (chained) TC operation
• Test for compare and capture TC operation