avr32/components/memory/sdram/mt48lc16m16a2tg7e/unit_tests/main.c File Reference

Unit tests for MT48LC16m16a2tg7 SDRAM component.

Copyright (c) 2011-2018 Microchip Technology Inc. and its subsidiaries.

#include <stdint.h>
#include <stdbool.h>
#include <asf.h>
#include <string.h>
#include <conf_test.h>
#include <unit_tests.h>

Functions
int	main (void)
	Run unit tests for MT48LC16m16a2tg7 SDRAM. More...

Variables
static struct ebi_test_params	params
	Test setup. More...

int main

(

void

)

Run unit tests for MT48LC16m16a2tg7 SDRAM.

Returns

0 which should never occur.

References usart_options_t::baudrate, board_init(), DEFINE_TEST_ARRAY, DEFINE_TEST_CASE, DEFINE_TEST_SUITE, NULL, run_data_integrity_test(), sdramc_init(), stdio_serial_init(), sysclk_get_cpu_hz(), sysclk_init(), test_set_data(), test_suite_run(), and usart_serial_options.

struct ebi_test_params params

static

Initial value:

= {
    .base = (volatile unsigned long *)SDRAM,
    .size = (uint32_t)SDRAM_SIZE,
}

Test setup.

Referenced by run_data_integrity_test().