DAC unit tests on Xplain using ADC Documentation

Introduction

This is the unit test for the XMEGA DAC driver using the chip ADC. The test requires the following external connection on the board that runs the tests:

• (PA1, PA3, PA5, PA7) connected together (J2 on XMEGA-A1 Xplained board)
• (PA0, PA2, PA4, PA6) connected together (J2 on XMEGA-A1 Xplained board)

The DAC outputs are available on PA2 and PA3, leaving two groups of four ADC pins connected to the two DAC output pins.

As there will be variations in the value output on the DAC output and the ADC input, all test measurements will have a range of acceptable values that lie above and below the expected value. The size of this range can be configured in the conf_test.h header file and have separate ranges for 8-bit and 12-bit results.

Main Files

• unit_tests.c
• conf_adc.h
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h

Device Info

This example has been tested with the following setup(s):

• XMEGA-A1 Xplained - should also work on the XMEGA-A3BU Xplained with the same external connections

Description of the unit tests

See the documentation for the individual unit test functions here for detailed descriptions of the tests.

Dependencies

This example depends directly on the following modules:

• Test Suite Framework
• DAC driver
• ADC driver

Compilation info

This software was written for the GNU GCC and IAR for AVR. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.
Support and FAQ: https://www.microchip.com/support/