Macros
#define	EEPROM_ERASED 0xff

#define	TEST_ATOMIC_WRITE_PAGE 2

#define	TEST_ERASE_BYTES_PAGE_1 4

#define	TEST_ERASE_BYTES_PAGE_2 5

#define	TEST_ERASE_PAGE 2

#define	TEST_SPLIT_WRITE_PAGE 3

#define	TEST_WRITE_PAGE 1

Functions
static bool	is_eeprom_page_equal_to_buffer (uint8_t page_addr, uint8_t *buffer)
	Check if an EEPROM page is equal to a memory buffer. More...

int	main (void)

static void	set_buffer (uint8_t *buffer, uint8_t value)
	Set all values of a memory buffer to a given value. More...

static status_code_t	test_atomic_write (void)
	Test nvm_eeprom_load_byte_to_buffer(), nvm_eeprom_flush_buffer() and nvm_eeprom_atomic_write_page() More...

static status_code_t	test_erase (void)
	Test nvm_eeprom_erase_all(). More...

static status_code_t	test_erase_bytes (void)
	Test nvm_eeprom_erase_bytes_in_page() and nvm_eeprom_erase_bytes_in_all_pages() More...

static status_code_t	test_split_write (void)
	Test nvm_eeprom_split_write_page() More...

static status_code_t	test_write (void)
	Test nvm_eeprom_erase_page() and nvm_eeprom_write_byte(). More...

Variables
uint8_t	buffer [EEPROM_PAGE_SIZE]
	Memory buffer to use during testing. More...

#define EEPROM_ERASED 0xff

Referenced by test_atomic_write(), test_erase(), test_erase_bytes(), test_split_write(), and test_write().

#define TEST_ATOMIC_WRITE_PAGE 2

Referenced by test_atomic_write().

#define TEST_ERASE_BYTES_PAGE_1 4

Referenced by test_erase_bytes().

#define TEST_ERASE_BYTES_PAGE_2 5

Referenced by test_erase_bytes().

#define TEST_ERASE_PAGE 2

Referenced by test_erase().

#define TEST_SPLIT_WRITE_PAGE 3

Referenced by test_split_write().

#define TEST_WRITE_PAGE 1

Referenced by test_write().

static bool is_eeprom_page_equal_to_buffer	(	uint8_t	page_addr,
		uint8_t *	buffer
	)

static

Check if an EEPROM page is equal to a memory buffer.

References EEPROM_PAGE_SIZE, and nvm_eeprom_read_byte().

Referenced by test_atomic_write(), test_erase(), test_erase_bytes(), test_split_write(), and test_write().

int main ( void )

References board_init(), gpio_toggle_pin, LED_PIN_0, LED_PIN_1, LED_PIN_2, LED_PIN_3, LED_PIN_4, LED_PIN_7, STATUS_OK, test_atomic_write(), test_erase(), test_erase_bytes(), test_split_write(), and test_write().

static void set_buffer	(	uint8_t *	buffer,
		uint8_t	value
	)

static

Set all values of a memory buffer to a given value.

References EEPROM_PAGE_SIZE.

Referenced by test_atomic_write(), test_erase(), test_erase_bytes(), test_split_write(), and test_write().

static status_code_t test_atomic_write ( void )

static

Test nvm_eeprom_load_byte_to_buffer(), nvm_eeprom_flush_buffer() and nvm_eeprom_atomic_write_page()

Test procedure:

Erase the TEST_ATOMIC_WRITE_PAGE page.
Load byte and then flush the buffer at one location.
Load two more bytes at a different location.
Write the page.
Verify that only two bytes are written and the rest of the page is erased.

Returns: STATUS_OK if test succeeded, otherwise ERR_BAD_DATA

References buffer, EEPROM_ERASED, ERR_BAD_DATA, is_eeprom_page_equal_to_buffer(), nvm_eeprom_atomic_write_page(), nvm_eeprom_erase_page(), nvm_eeprom_flush_buffer(), nvm_eeprom_load_byte_to_buffer(), set_buffer(), STATUS_OK, and TEST_ATOMIC_WRITE_PAGE.

Referenced by main().

static status_code_t test_erase ( void )

static

Test nvm_eeprom_erase_all().

Test procedure:

Write one byte to the TEST_ERASE_PAGE page.
Erase all memory locations
Verify that the EEPROM is erased by a spot test on the TEST_ERASE_PAGE page.

Returns: STATUS_OK if test succeeded, otherwise ERR_BAD_DATA

References buffer, EEPROM_ERASED, EEPROM_PAGE_SIZE, ERR_BAD_DATA, is_eeprom_page_equal_to_buffer(), nvm_eeprom_erase_all(), nvm_eeprom_write_byte(), set_buffer(), STATUS_OK, and TEST_ERASE_PAGE.

Referenced by main().

static status_code_t test_erase_bytes ( void )

static

Test nvm_eeprom_erase_bytes_in_page() and nvm_eeprom_erase_bytes_in_all_pages()

Test procedure:

Write two bytes into page TEST_ERASE_BYTES_PAGE_1 and TEST_ERASE_BYTES_PAGE_2
Load value to page buffer in the address of the first byte
Erase first byte of TEST_ERASE_BYTES_PAGE_1
Verify that first byte is deleted in TEST_ERASE_BYTES_PAGE_1
Load value to page buffer in the address of the first byte
Erase first byte of all pages
Verify that first byte is deleted in TEST_ERASE_BYTES_PAGE_2

Returns: STATUS_OK if test succeeded, otherwise ERR_BAD_DATA

References buffer, EEPROM_ERASED, EEPROM_PAGE_SIZE, ERR_BAD_DATA, is_eeprom_page_equal_to_buffer(), nvm_eeprom_erase_bytes_in_all_pages(), nvm_eeprom_erase_bytes_in_page(), nvm_eeprom_load_byte_to_buffer(), nvm_eeprom_write_byte(), set_buffer(), STATUS_OK, TEST_ERASE_BYTES_PAGE_1, and TEST_ERASE_BYTES_PAGE_2.

Referenced by main().

static status_code_t test_split_write ( void )

static

Test nvm_eeprom_split_write_page()

Test procedure:

Erase TEST_SPLIT_WRITE_PAGE page and then write 2 bytes to TEST_SPLIT_WRITE_PAGE by using an atomic write
Write 1 additional byte at another location using a split write
Verify that all 3 bytes written correctly and that the rest of the page is erased.