Microchip® Advanced Software Framework

classb_sram.h File Reference

SRAM test settings.

Application note:
AVR1610: Guide to IEC60730 Class B compliance with XMEGA

Copyright (c) 2011-2018 Microchip Technology Inc. and its subsidiaries.

Macros

Configuration settings
#define CLASSB_NSECS   16
 Number of sections to divide the SRAM into for testing. More...
 
#define CLASSB_OVERLAP   25UL
 Overlap between memory sections (in % of CLASSB_SEC_SIZE). More...
 
#define CLASSB_SRAM_INTRAWORD_TEST
 Configuration to enable intra-word test. More...
 
Constants for internal use
Attention
These should not be modified by user!
#define CLASSB_SEC_SIZE   (INTERNAL_SRAM_SIZE / CLASSB_NSECS)
 Size of each segment, in bytes. More...
 
#define CLASSB_SEC_REM   (INTERNAL_SRAM_SIZE % CLASSB_NSECS)
 Size of the last test segment, in bytes. More...
 
#define CLASSB_OVERLAP_SIZE   ((CLASSB_SEC_SIZE * CLASSB_OVERLAP) / 100)
 Size of overlap in bytes. More...
 
#define CLASSB_NSEC_TOTAL   CLASSB_NSECS
 Total number of segments including remainder, if present. More...
 

Functions

void classb_march_x (register volatile uint8_t *p_sram, register volatile uint8_t *p_buffer, register uint16_t size)
 Run March X algorithm on specified memory range. More...
 
Class B test
void classb_sram_test (void)
 Execute March X test on one memory section at a time. More...