SRAM test settings.
Copyright (c) 2011-2018 Microchip Technology Inc. and its subsidiaries.
Macros | |
Configuration settings | |
#define | CLASSB_NSECS 16 |
Number of sections to divide the SRAM into for testing. More... | |
#define | CLASSB_OVERLAP 25UL |
Overlap between memory sections (in % of CLASSB_SEC_SIZE ). More... | |
#define | CLASSB_SRAM_INTRAWORD_TEST |
Configuration to enable intra-word test. More... | |
Constants for internal use | |
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#define | CLASSB_SEC_SIZE (INTERNAL_SRAM_SIZE / CLASSB_NSECS) |
Size of each segment, in bytes. More... | |
#define | CLASSB_SEC_REM (INTERNAL_SRAM_SIZE % CLASSB_NSECS) |
Size of the last test segment, in bytes. More... | |
#define | CLASSB_OVERLAP_SIZE ((CLASSB_SEC_SIZE * CLASSB_OVERLAP) / 100) |
Size of overlap in bytes. More... | |
#define | CLASSB_NSEC_TOTAL CLASSB_NSECS |
Total number of segments including remainder, if present. More... | |
Functions | |
void | classb_march_x (register volatile uint8_t *p_sram, register volatile uint8_t *p_buffer, register uint16_t size) |
Run March X algorithm on specified memory range. More... | |
Class B test | |
void | classb_sram_test (void) |
Execute March X test on one memory section at a time. More... | |