unit_tests.c File Reference

Unit tests for at24cxx driver.

Copyright (c) 2011-2018 Microchip Technology Inc. and its subsidiaries.

#include <stdint.h>
#include <stdbool.h>
#include <board.h>
#include <sysclk.h>
#include <string.h>
#include <unit_test/suite.h>
#include <stdio_serial.h>
#include <conf_clock.h>
#include <conf_board.h>
#include <conf_test.h>
#include <at24cxx.h>
#include "twi.h"

Macros
#define	AT24C_MEM_ADDR   0
	Memory Start Address of AT24CXX chips. More...
#define	AT24C_TWI_CLK   400000UL
	TWI Bus Clock 400kHz. More...
#define	MEMORY_PATTERN   TEST_DATA
#define	PAGE_ADDR   511UL
#define	PAGE_SIZE   64UL
#define	TEST_DATA   0xA5u
	Test data. More...
#define	TEST_DATA_LENGTH   (sizeof(test_data_tx)/sizeof(uint8_t))

Functions
static bool	buffer_cmp (const uint8_t *pbuf_0, const uint8_t *pbuf_1, uint32_t len)
static void	buffer_fill (uint8_t *pbuf, uint32_t len, const uint8_t pattern)
int	main (void)
	Run AT24CXX driver unit tests. More...
static void	run_test_byte_access (const struct test_case *test)
	Test data write API function. More...
static void	run_test_continuous_access (const struct test_case *test)
	Test data read API function. More...
static void	run_test_fill_pattern (const struct test_case *test)
	Test data read/write API functions. More...
static void	run_test_page_access (const struct test_case *test)
	Test data read API function. More...
static void	run_test_setup (const struct test_case *test)
	Test data read/write API functions. More...

Variables
uint8_t	page_read_buf [PAGE_SIZE]
uint8_t	page_write_buf [PAGE_SIZE]
bool	result = false
static uint8_t	test_data_rx [TEST_DATA_LENGTH]
static uint8_t	test_data_tx []

#define AT24C_MEM_ADDR   0

Memory Start Address of AT24CXX chips.

Referenced by run_test_byte_access(), run_test_continuous_access(), and run_test_fill_pattern().

#define AT24C_TWI_CLK   400000UL

TWI Bus Clock 400kHz.

Referenced by run_test_setup().

#define MEMORY_PATTERN   TEST_DATA

Referenced by run_test_fill_pattern(), and run_test_page_access().

#define PAGE_ADDR   511UL

Referenced by run_test_page_access().

#define PAGE_SIZE   64UL

Referenced by run_test_page_access().

#define TEST_DATA   0xA5u

Test data.

Referenced by run_test_byte_access().

#define TEST_DATA_LENGTH   (sizeof(test_data_tx)/sizeof(uint8_t))

Referenced by run_test_continuous_access(), and run_test_fill_pattern().

static bool buffer_cmp ( const uint8_t *  pbuf_0, const uint8_t *  pbuf_1, uint32_t  len  )

static

Referenced by run_test_continuous_access(), run_test_fill_pattern(), and run_test_page_access().

static void buffer_fill ( uint8_t *  pbuf, uint32_t  len, const uint8_t  pattern  )

static

Referenced by run_test_continuous_access(), run_test_fill_pattern(), and run_test_page_access().

int main

(

void

)

Run AT24CXX driver unit tests.

References at24cxx_reset(), uart_rs232_options::baudrate, board_init(), CONF_TEST_BAUDRATE, CONF_TEST_CHARLENGTH, CONF_TEST_PARITY, CONF_TEST_STOPBITS, CONF_TEST_USART, CONSOLE_UART_ID, DEFINE_TEST_ARRAY, DEFINE_TEST_CASE, DEFINE_TEST_SUITE, run_test_byte_access(), run_test_continuous_access(), run_test_fill_pattern(), run_test_page_access(), run_test_setup(), stdio_serial_init(), sysclk_enable_peripheral_clock(), sysclk_init(), and test_suite_run().

static void run_test_byte_access ( const struct test_case *  test )

static

Test data write API function.

This test calls the data write API function and check if the write operation succeeded.

Parameters

test	Current test case.

References AT24C_MEM_ADDR, AT24C_READ_SUCCESS, AT24C_WRITE_SUCCESS, at24cxx_read_byte(), at24cxx_write_byte(), result, test_assert_true, and TEST_DATA.

Referenced by main().

static void run_test_continuous_access ( const struct test_case *  test )

static

Test data read API function.

This test calls the data read API function and check if the read operation succeeded.

Parameters

test	Current test case.

References AT24C_MEM_ADDR, AT24C_READ_SUCCESS, AT24C_WRITE_SUCCESS, at24cxx_read_continuous(), at24cxx_write_continuous(), buffer_cmp(), buffer_fill(), result, test_assert_true, TEST_DATA_LENGTH, test_data_rx, and test_data_tx.

Referenced by main().

static void run_test_fill_pattern ( const struct test_case *  test )

static

Test data read/write API functions.

This test calls the data read/write API functions and check the data consistency.

Parameters

test	Current test case.

References AT24C_MEM_ADDR, AT24C_READ_SUCCESS, AT24C_WRITE_SUCCESS, at24cxx_fill_pattern(), at24cxx_read_continuous(), buffer_cmp(), buffer_fill(), MEMORY_PATTERN, result, test_assert_true, TEST_DATA_LENGTH, test_data_rx, and test_data_tx.

Referenced by main().

static void run_test_page_access ( const struct test_case *  test )

static

Test data read API function.

This test calls the data read API function and check if the read operation succeeded.

Parameters

test	Current test case.

References AT24C_WRITE_SUCCESS, at24cxx_read_page(), at24cxx_write_page(), buffer_cmp(), buffer_fill(), MEMORY_PATTERN, PAGE_ADDR, page_read_buf, PAGE_SIZE, page_write_buf, result, and test_assert_true.

Referenced by main().

static void run_test_setup ( const struct test_case *  test )

static

Test data read/write API functions.

This test calls the data read/write API functions and check the data consistency.

Parameters

test	Current test case.

References AT24C_TWI_CLK, BOARD_AT24C_TWI_INSTANCE, twi_options::master_clk, result, twi_options::speed, sysclk_get_cpu_hz(), test_assert_true, twi_master_setup(), and TWI_SUCCESS.

Referenced by main().

uint8_t page_read_buf[PAGE_SIZE]

Referenced by run_test_page_access().

uint8_t page_write_buf[PAGE_SIZE]

Referenced by run_test_page_access().

bool result = false

Referenced by run_test_byte_access(), run_test_continuous_access(), run_test_fill_pattern(), run_test_page_access(), run_test_setup(), and test_case_run().

uint8_t test_data_rx[TEST_DATA_LENGTH]

static

Referenced by run_test_continuous_access(), and run_test_fill_pattern().

uint8_t test_data_tx[]

static

Initial value:

= {
    'A', 'T', '2', '4', 'C', 'X', 'X', ' ', 'U', 'N', 'I', 'T', ' ',
    'T', 'E', 'S', 'T', 'S'
}

Referenced by run_test_continuous_access(), and run_test_fill_pattern().