AT30TS Temperature Sensor driver example.
Copyright (c) 2015-2018 Microchip Technology Inc. and its subsidiaries.
Functions | |
int | main (void) |
Main entry of example application. More... | |
void | test_fail_indication (void) |
This function is used to indicate a test failure. More... | |
int main | ( | void | ) |
Main entry of example application.
References AT30TS7_POL_ACTIVE_LOW, AT30TS7_RES12, AT30TS_POL, attach_device(), board_init(), twi_options_t::chip, _sensor_data::config_reg, delay_ms, EE_TEST_ADDR, EVENT_PIN, EXAMPLE_TS_DEVICE, EXAMPLE_TS_DEVICE_ADDR, _sensor_data::_temperature::ftemp, gfx_mono_draw_string(), gfx_mono_generic_draw_filled_rect(), gfx_mono_init, GFX_PIXEL_CLR, ioport_configure_pin(), IOPORT_DIR_INPUT, IOPORT_DIR_OUTPUT, ioport_set_pin_high(), ioport_set_pin_low(), irq_initialize_vectors, _sensor_data::_temperature::itemp, LED_CRIT, LED_HIGH, LED_LOW, LED_NORM, NHD_C12832A1Z_BACKLIGHT, _sensor_data::option, PATTERN_TEST_LENGTH, pos, read_config(), read_nvconfig(), read_nvthigh(), read_nvtlow(), read_tcrit(), read_temperature(), read_temperature_high(), read_temperature_low(), set_config_option(), twi_options_t::speed, sysclk_init(), sysfont, _sensor_data::temperature, test_fail_indication(), ts75_copy_nonvol_vol_register(), ts75_copy_vol_nonvol_register(), ts_read_eeprom(), ts_write_memory(), twi_master_setup(), TWI_MODULE, TWI_SPEED, TWI_SUCCESS, _sensor_data::value, write_config(), write_tcrit(), write_temperature_high(), and write_temperature_low().
void test_fail_indication | ( | void | ) |
This function is used to indicate a test failure.
References delay_ms, ioport_set_pin_high(), ioport_set_pin_low(), and LED_CRIT.
Referenced by main().