FIFO service unit tests on for SAM4L8 Xplained Pro Documentation

Introduction

This is the unit test application for the FIFO service. It consists of test cases for the following:

• size reporting on flushed/empty and used FIFO
• under- and overflow on pull/push
• data integrity for push/pull

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h

Device Info

All Atmel devices can be used.

Description of the unit tests

See the documentation for the individual unit test functions here for detailed descriptions of the tests.

Dependencies

This example depends directly on the following modules:

• Test Suite Framework
• FIFO service

Compilation info

This software was written for the GNU GCC and IAR for AVR or ARM. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.