External Interrupt unit tests on atmega256rfr2_atmega256rfr2_xplained_pro Documentation

Introduction

This is the unit test for the MEGARF Ext Interrupt driver. Ext interrupt is getting trigged by changing the pin status on external pin change interrupt pins. This is being simulated by connecting one of the GPIO port pin configured as output to external pin change interrupt pin using jumper wire. By outputing high or low on GPIO pin the status of external pin change interrupt pin connected to that GPIO pin will be changing and hence interrupt will get triggered.

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h

Device Info

This example has been tested with the following setup(s):

• atmega128rfa1_stk600 and atmega256rfr2_xplained_pro

Description of the unit tests

See the documentation for the individual unit test functions here for detailed descriptions of the tests.

Dependencies

This example depends directly on the following modules:

• Test Suite Framework
• USART module (USART)
• External Interrupt Driver

Compilation info

This software was written for the GNU GCC and IAR for AVR. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.