AFEC Feature Test Example

Purpose

The example demonstrates test some features inside the microcontroller.

Requirements

This example can be used on SAM4E-EK boards.

Description

The example is aimed to test some features inside the microcontroller. Users can select testing feature by configuration menu in the terminal.

Usage

1. Build the program and download it into the evaluation board.
2. On the computer, open and configure a terminal application (e.g., HyperTerminal on Microsoft Windows) with these settings:
   • 115200 bauds
   • 8 bits of data
   • No parity
   • 1 stop bit
   • No flow control
3. In the terminal window, the following text should appear (values depend on the board and the chip used):

   -- AFEC Feature Test Examplexxx --
   -- xxxxxx-xx
   -- Compiled: xxx xx xxxx xx:xx:xx --
   =========================================================
   Menu: press a key to test feature.
   ---------------------------------------------------------
   -- 0: Gain Test --
   -- 1: Dual AFEC Conversion Test --
   -- 2: Differential Input Test --
   -- 3: User Sequence Test --
   -- 4: Typical Application Test--