LCDCA unit tests for SAM4L-EK Documentation

Introduction

This is the unit test application for LCDCA driver. It consists of test cases for the following:

• LCDCA initialization test
• LCDCA blink feature test
• LCDCA automated feature test (sequential and scrolling)
• LCDCA autonomous segment feature test LCDCA contrast change test

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_sleepmgr.h
• conf_uart_serial.h

Device Info

All SAM devices with a LCDCA and a USART module can be used.

Description of the unit tests

See the documentation for the individual unit test functions here for detailed descriptions of the tests.

Dependencies

This example depends directly on the following modules:

• Test Suite Framework
• Common Clock service

Compilation info

This software is written for GNU GCC and IAR Embedded Workbench for Atmel. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.
Support and FAQ: https://www.microchip.com/support/