sam/drivers/spi/unit_tests/unit_tests.c File Reference

Unit tests for SPI driver.

Copyright (c) 2011-2018 Microchip Technology Inc. and its subsidiaries.

#include <stdint.h>
#include <stdbool.h>
#include <board.h>
#include <sysclk.h>
#include <spi.h>
#include <string.h>
#include <unit_test/suite.h>
#include <stdio_serial.h>
#include <conf_test.h>
#include <conf_board.h>

Macros
#define	ns_to_dlybct(ck, ns)   ((((ns) / 32 * ((ck) / 1000000)) / 1000) + 1)
	Convert ns to SPI DLYBCT. More...
#define	ns_to_dlybs(ck, ns)   ((((ns) * ((ck) / 1000000)) / 1000) + 1)
	Convert ns to SPI DLYBS. More...
#define	OFFSET_CSR   0x30
	Register offset for _CSR. More...
#define	OFFSET_IER   0x14
	Register offset for _IMR. More...
#define	OFFSET_MR   0x04
	Register offset for _MR. More...
#define	SPI_CLK_PHASE   0
	Clock phase. More...
#define	SPI_CLK_POLARITY   1
	Clock polarity. More...
#define	SPI_DLYBCT   0x10
	Delay between consecutive transfers. More...
#define	SPI_DLYBS   0x40
	Delay before SPCK. More...
#define	TEST_CLOCK   10000000
	Test SPI clock. More...
#define	TEST_PATTERN   0xA5
	Byte to transfer for test. More...
#define	TEST_PCS   ((~(1u << CONF_TEST_SPI_NPCS)) & 0xF)
	PCS to use for test. More...

Functions
void	CONF_TEST_SPI_HANDLER (void)
	Test SPI interrupt handler. More...
int	main (void)
	Run SPI driver unit test. More...
static void	run_spi_ctrl_test (const struct test_case *test)
	Test SPI setting. More...
static void	run_spi_trans_test (const struct test_case *test)
	Test SPI transfer. More...
static void	run_spi_writeprotect_test (const struct test_case *test)
	Test SPI write protection. More...

Variables
volatile bool	g_b_spi_interrupt_rx_ready = false
	RX interrupt occurred. More...
volatile bool	g_b_spi_interrupt_tx_ready = false
	TX interrupt occurred. More...

#define ns_to_dlybct	(		ck,
			ns
	)		((((ns) / 32 * ((ck) / 1000000)) / 1000) + 1)

Convert ns to SPI DLYBCT.

#define ns_to_dlybs	(		ck,
			ns
	)		((((ns) * ((ck) / 1000000)) / 1000) + 1)

Convert ns to SPI DLYBS.

#define OFFSET_CSR   0x30

Register offset for _CSR.

Referenced by run_spi_writeprotect_test().

#define OFFSET_IER   0x14

Register offset for _IMR.

#define OFFSET_MR   0x04

Register offset for _MR.

Referenced by run_spi_writeprotect_test().

#define SPI_CLK_PHASE   0

Clock phase.

Referenced by run_spi_trans_test().

#define SPI_CLK_POLARITY   1

Clock polarity.

Referenced by run_spi_trans_test().

#define SPI_DLYBCT   0x10

Delay between consecutive transfers.

Referenced by run_spi_trans_test().

#define SPI_DLYBS   0x40

Delay before SPCK.

Referenced by run_spi_trans_test().

#define TEST_CLOCK   10000000

Test SPI clock.

Referenced by run_spi_trans_test().

#define TEST_PATTERN   0xA5

Byte to transfer for test.

Referenced by run_spi_trans_test().

#define TEST_PCS   ((~(1u << CONF_TEST_SPI_NPCS)) & 0xF)

PCS to use for test.

Referenced by run_spi_trans_test().

void CONF_TEST_SPI_HANDLER

(

void

)

Test SPI interrupt handler.

References g_b_spi_interrupt_rx_ready, g_b_spi_interrupt_tx_ready, spi_disable_interrupt(), spi_read_status(), and status.

int main

(

void

)

Run SPI driver unit test.

References uart_rs232_options::baudrate, board_init(), DEFINE_TEST_ARRAY, DEFINE_TEST_CASE, DEFINE_TEST_SUITE, NULL, run_spi_ctrl_test(), run_spi_trans_test(), run_spi_writeprotect_test(), stdio_serial_init(), sysclk_init(), test_suite_run(), and usart_serial_options.

static void run_spi_ctrl_test ( const struct test_case *  test )

static

Test SPI setting.

This test tests SPI reset/enable/disable.

Parameters

test	Current test case.

References SAM4L, spi_enable(), spi_enable_clock(), spi_is_enabled(), spi_reset(), and test_assert_true.

Referenced by main().

static void run_spi_trans_test ( const struct test_case *  test )

static

Test SPI transfer.

This test tests SPI read/write.

Parameters

test	Current test case.

References g_b_spi_interrupt_rx_ready, g_b_spi_interrupt_tx_ready, SAM4L, SPI_CLK_PHASE, SPI_CLK_POLARITY, spi_disable(), spi_disable_interrupt(), spi_disable_loopback(), spi_disable_mode_fault_detect(), SPI_DLYBCT, SPI_DLYBS, spi_enable(), spi_enable_interrupt(), spi_enable_loopback(), SPI_ERROR_TIMEOUT, SPI_OK, spi_read(), spi_reset(), spi_set_baudrate_div(), spi_set_bits_per_transfer(), spi_set_clock_phase(), spi_set_clock_polarity(), spi_set_lastxfer(), spi_set_master_mode(), spi_set_peripheral_chip_select_value(), spi_set_transfer_delay(), spi_set_variable_peripheral_select(), spi_write(), sysclk_get_peripheral_hz(), test_assert_true, TEST_CLOCK, TEST_PATTERN, and TEST_PCS.

Referenced by main().

static void run_spi_writeprotect_test ( const struct test_case *  test )

static

Test SPI write protection.

Parameters

test	Current test case.

References OFFSET_CSR, OFFSET_MR, spi_get_writeprotect_status(), spi_set_writeprotect(), and test_assert_true.

Referenced by main().

volatile bool g_b_spi_interrupt_rx_ready = false

RX interrupt occurred.

Referenced by CONF_TEST_SPI_HANDLER(), and run_spi_trans_test().

volatile bool g_b_spi_interrupt_tx_ready = false

TX interrupt occurred.

Referenced by CONF_TEST_SPI_HANDLER(), and run_spi_trans_test().