Unit Tests

Introduction

This documentation has been automatically generated, and documents the source code found in the Microchip Advanced Software Framework (ASF).

Unit-tests

	Unit Tests for the SAM C21 AC driver
	Unit Tests for the SAM C21 ADC Driver
	Unit Tests for the SAM C21 EEPROM emulator service
	Unit Tests for the SAM C21 Event system driver
	Unit Tests for the SAM C21 External Interrupt Driver
	Unit Tests for the SAM C21 FREQM driver
	Unit Tests for the SAM C21 I2C Driver
	Unit Tests for the SAM C21 NVM Driver
	Unit Tests for the SAM C21 RTC calendar Driver
	Unit Tests for the SAM C21 RTC Driver
	Unit Tests for the SAM C21 RWW EEPROM emulator service
	Unit Tests for the SAM C21 SPI Driver
	Unit Tests for the SAM C21 TC Driver
	Unit Tests for the SAM C21 TCC Driver
	Unit Tests for the SAM C21 USART Driver
	Unit Tests for the SAM C21 WDT Driver