Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The following kit is required for carrying out the test:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The following kit is required for carrying out the test:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
The NVMCTRL_FUSES_EEPROM_SIZE
has to be set to 0x00 in the fuse setting of the device to run this test. Atmel Studio can be used to set this fuse (Tools->Device Programming).
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The following kit is required for carrying out the test:
The following connections has to be made using wires: -SAM D20 Xplained Pro
SAM R21 Xplained Pro
SAM L21 Xplained Pro
SAM L22 Xplained Pro.
SAM C21 Xplained Pro.
SAM R30 Xplained Pro
SAM R34 Xplained Pro
WLR 089 Xplained Pro
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
This unit test carries out test for three modes of event propagation: Synchronous, Resynchronized & Asynchronous.
The following kits are supported for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This application implements a USB Device CDC and a I2C master for SAM devices, it works as a bridge between I2C slave and the USB CDC interface.
This application has been tested on following boards:
A python script (bootloader.py in script folder) is used on the host PC to send data over USB CDC interface, example application bin file(to be programmed) starts at 0x2000. To run the python script, execute a command for example as below: python bootloader.py -p COM20 -i led_toggle_flash.bin Make sure that python environment is installed on your PC,
For SAM D21 Xplained Pro: I2C slave should be connected to PIN11 (PA08 - SDA) and PIN12 (PA09 - SCL) on External header 1 (EXT1).
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Support and FAQ: visit Microchip Support
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
Tests will be performed for rising and falling edges of the external signal.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
While some devices require exact timing, and therefore require an external calibration crystal or other high-accuracy clock source, other applications with looser accuracy requirements may use the internal RC Oscillator(s) for space and/or cost reasons. However, this can lead to unstable communication interfaces if the internal oscillator is not first calibrated against an accurate reference clock.
This application uses a known external reference frequency to calibrate the internal 8MHz (nominal) RC Oscillator, OSC8M, so that it is as close as possible to the desired 8MHz frequency.
This application has been tested on following boards:
On startup, the application will immediately begin calibration of the OSC8M internal oscillator, against a 32.768KHz watch crystal attached to the device XOSC32K pins (see device datasheet). As the possible calibration values are cycled through, the board LED will turn on each time a better match is found, and turn off when an equal or lesser calibration value is tested. Once the best values are found, the results are printed to the device USART and the board LED will flash rapidly to signal the end of the calibration sequence.
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
Tests will be performed for data transmitting and receiving of I2S.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
A timer is used to guarantee the DAC conversions are performed at the correct sample rate, using the Event System module of the device to link the periodic timer output events to the DAC module to trigger new sample conversions.
This application has been tested on following boards:
The device's DAC channel output should be connected to an audio amplifier, speaker, oscilloscope or other similar monitoring equipment so that the generated waveform can be monitored.
On startup the device hardware will be configured, and the example will enter an infinite loop. Each time the board button is pressed, the embedded waveform will be output through the DAC and the board LED will be toggled
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
Input to the AC is provided with the DAC module.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This application demonstrates a runtime XOSC32K (external 32KHz crystal oscillator) failure detector, using hardware timer peripherals and the SAM event system.
A pair of timers are linked together; one with a clock source from the XOSC32K 32.768KHz external clock, and another from the OSC32K 32.768KHz internal RC clock source. Each time the XOSC32K timer reaches a configurable count value, a hardware event resets the second timer using the OSC32K clock source.
If the OSC32K clocked timer reaches a configurable count value before it is reset by the XOSC32K timer, the XOSC32K clock source is considered failed and a callback function is executed. If instead the XOSC32K closed clocked timer resets the OSC32K clocked timer, the oscillator is considered OK and another callback function is executed.
In the example application, the DFLL reference clock is automatically switched between the internal and external 32KHz clock sources depending on the external reference availability.
This application has been tested on following boards:
Connect an oscilloscope to PA28 of the SAM D20/D21 or PB22 of SAMR21 or PA08 of SAM D10/D11 or PA27 of SAML21 or PA14 of SAMR30 Xplained Pro. Run the example application, and press and hold the board button to turn off the external XOSC32K crystal clock source to observe the fail-over to the internal clock source. Releasing the button will re-enable the external crystal.
The board LED will be turned on when the external crystal is used, and will be turned off when the internal RC is used due to a crystal failure detection.
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
As many electronic designs evolve rapidly there is a growing need for being able to update products, which have already been shipped or sold. Microcontrollers that support boot loader facilitates updating the application flash section without the need of an external programmer, are of great use in situations where the application has to be updated on the field. The boot loader may use various interfaces like SPI, UART, TWI, Ethernet etc.
This application implements a I2C Slave bootloader for SAM devices.
This application has been tested on following boards:
This bootloader implementation consumes around 8000 bytes (approximately), which is 32 rows of Program Memory space starting from 0x00000000. BOOTPROT fuses on the device can be set to protect first 32 rows of the program memory which are allocated for the BOOT section. So, the end user application should be generated with starting address as 0x00002000.
There are no prerequisites for this implementation
SAM device in SAM Xplained Pro kit is used as the I2C Slave. I2C master should be connected to PIN11 (PA08 - SDA) and PIN12 (PA09 - SCL) on External header 1 (EXT1) of SAM D20/D21 Xplained Pro. I2C master should be connected to PIN11 (PA16 - SDA) and PIN12 (PA17 - SCL) on External header 1 (EXT1) of SAM R21 Xplained Pro. I2C master should be connected to PIN11 (PA22 - SDA) and PIN12 (PA23 - SCL) on External header 1 (EXT1) of SAM D10/D11 Xplained Pro. I2C master should be connected to PIN11 (PB30 - SDA) and PIN12 (PB31 - SCL) on External header 1 (EXT1) of SAM L22 Xplained Pro. I2C master should be connected to PIN11 (PA08 - SDA) and PIN12 (PA09 - SCL) on External header 1 (EXT1) of SAM L21 Xplained Pro. SW0 will be configured as BOOT_LOAD_PIN and LED0 will be used to display the bootloader status. LED0 will be ON when the device is in bootloader mode.
The bootloader is located at the start of the program memory and is executed at each reset/power-on sequence. Initially check the status of a user configurable BOOT_LOAD_PIN.
Initialize the following
Once the programming is completed, enable Watchdog Timer with a timeout period of 256 clock cycles and wait in a loop for Watchdog to reset the device.
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The test suite consists of test cases for the following functionality:
The test suite has been written to test with an AT25DF081A on the EXT1 header of an Xplained Pro board.
Test reporting is done via UART configured on CONF_STDIO_USART_MODULE, with baud rate CONF_STDIO_BAUDRATE. The convention is to use EDBG CDC.
Connect a SerialFlash () wing board to EXT1 of the Xplained Pro. The SPI pin mapping is according to the convention, meaning the regular MISO, MOSI, SCK and SS_0 as defined in the board definition header file.
This software was written for the GNU GCC for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The following kit is required for carrying out the test:
The following operation has to be made:
To run the test:
Conect board to external power supply though "PWR 5.0 IN and GND", this power have higher priority than usb power supply, you can check the cpu voltage from VCC.
The terminal shows the results of the unit test.
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
Input to the ADC is provided with the DAC module.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The following kit can be used for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
3518a2958ff4695a84f9222901de2da524b4520d
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application has been tested on following boards:
This application use AIN0 as ADC input channel. When the measured voltage is lower than 0.5V, then the device will start toggling the led pin to signal that the low voltage condition has happened. Connect the PA02(EXT3 pin3) to GND in SAM D20/D21 Xplained Pro to trigger it. Connect the PA06(EXT1 pin3) to GND in SAM R21 Xplained Pro to trigger it. Connect the PA02(EXT1 pin3) to GND in SAM D10/D11 Xplained Pro to trigger it. Connect the PA03(EXT1 pin4) to GND in SAM L21/L22 Xplained Pro to trigger it. Connect the PA03_ADC_DAC_VREF(J701 pin4) to GND in SAM C21 Xplained Pro to trigger it. Connect the PA04(EXT1 pin14) to GND in SAM R30 Xplained Pro to trigger it.
If debugging it is also possible to start a debug session and place a breakpoint in the window callback that will trigger whenever the voltage has gone below the defined threshold.
The application can easily be modified to monitor other voltages by changing the input source and threshold values in the adc_setup
function.
The ADC is configured to perform hardware averaging on the measured value, where the ADC will sample the signal 16 times and find the average value in hardware. This smooths out high frequency noise.
To trigger the ADC conversions, the RTC is setup in 32-bit counter mode, clocked by the internal 32kHz oscillator divided by 32, giving a 1kHz input clock. A compare value of 1000 is used to trigger the ADC conversion every second.
The Event system is setup to route the compare match interrupt from the RTC to the ADC, and the ADC is configured to start a new conversion on an event input. The event channel is configured as an asynchronous channel, so no clock is needed for the event channel during sleep.
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The following kit is required for carrying out the test:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This application demonstrates a simple example to toggle the board LED.
This application has been tested on following boards:
The application uses system timer to generate periodic interrupts, once the interrupt occurs, LED0 will toggle.
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for WDT driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for the ADC driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for the BOD driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the AC driver.
This unit test carries out tests for the I2S driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This application calibrates the internal OSC8M (8MHz) oscillator of the device against a known, accurate external clock or crystal frequency.
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2S driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This application runs a suite of tests for the AT25DFx SerialFlash driver with any SPI HAL that is supported by the driver and for which setup code has been added to this application.
This unit test carries out tests for the BOD driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design, and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the USB Stack for applications, included in ASF as middleware service.
For more information on ASF USB Stack and ASF, refer to the online documentation at following link:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This example demonstrates the different functional modes of Analog Comparator (AC) module in SAM D21 devices.
Analog comparator is configured in different modes like level crossing detector, window mode detector, false spike avoider or SleepWalking one at a time by commenting / uncommenting the macro AC_MODE in the application example.
This application has been tested on following board:
A sine wave signal should be applied on pin PA04 in the SAM D21 Xplained pro board. More details on analog input signal specification can be found in application note 'Analog Comparator Application Examples'. The device's analog comparator output pin (PA12) should be connected to an oscilloscope so that the generated waveform can be monitored.
The waveform selection macro AC_MODE should be set to required AC example.
The application will first configure the system clock and then configures the analog comparator based on selected example mode. In level crossing application, the output pin PA12 will be set when the analog input is above a threshold level. In window mode application, the output pin will be set whenever the input signal goes out of a window with two threshold levels. In false spike avoider application, hysteresis and filter mode are enabled which avoid frequent toggling of AC output when the analog input oscillates around the detect threshold. In SleepWalking mode, the analog comparator is configured in single shot mode which performs comparison every 10ms which is timed from RTC and triggered through Event System that reduces the overall current consumption of the system.
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.