Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
The following kit is required for carrying out the test:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
Tests will be performed for rising and falling edges of the external signal.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This application demonstrates different sleep modes and performance levels, it can switch among ACTIVE mode, IDLE mode, STANDBY mode and BACKUP mode.
This application has been tested on following boards:
This application of SAML21 use AIN0(PA02, EXT1 pin10) and SAMR30 use (AIN6(PA06, EXT1 pin3)) as ADC input channel. BUTTON0 is used to wake up system from standby mode and IDLE mode. BUTTON0 is used as an external wake up pin to wake up system from BACKUP mode, the wakeup pin level is low.
The application covers the following case: Case 1: ACTIVE mode: Performance Level 0 at 12MHz Case 2: ACTIVE mode: Performance Level 2 at 48MHz Case 3: IDLE mode: Performance Level 0 at 12MHz Case 4: STANDBY mode:PD0,PD1 and PD2 in retention state Case 5: BACKUP mode Case 6: OFF mode Case 7: STANDBY mode:dynamic power sleepwalking
When in active Performance Level 2 mode, DFLL48M using XOSC32K as reference and running at 48MHz. When in active Performance Level 0 mode, internal Multi RC Oscillator running at 12MHz. In active mode, EDBG can be used to input command to select different modes.
IDLE,BACKUP and STANDBY modes can be waked up by BUTTON0. OFF mode can only exit if the RESET pin is activated.
In stanby mode(dynamic power sleepwalking), RTC, ADC, EVENT, and DMA modules are used. RTC generates compare value matched EVENT at a fixed interval and route it to ADC, ADC start to sample based on the EVENT, when one conversion is completed, DMA make peripheral-to-memory transfer from the ADC to the HMCRAMLP memory.
RTC is clocked by the internal ULP 32kHz oscillator divided by 64, giving a 512Hz input, and the compare value is 1000. ADC is clocked by the 4MHz from OSC16M divided by 64, giving a 64KHz input. So we can observe the consumption during the STANDBY mode.
The STANDBY mode takes about 30 seconds, and it covers the following cases: Case 13-1 PD0, PD1 and PD2 all in retention state. Case 13-2 PD0 in active state while PD1 and PD2 in retention state. Case 13-3 PD0 and PD1 in active state while PD2 in retention mode. Case 13-4 PD0, PD1 and PD2 all in active mode, and system wakes up. Case 13-4 PD0, PD1 and PD2 all in active mode, and system wakes up.
LED0 is used as an indication for different mode. when GCL0 clock frequency changes, LED0 will toggles LED0_TOGGLE_2 times. when exits from IDLE mode, LED0 will toggles LED0_TOGGLE_4 times. when exits from STANDBY mode, LED0 will toggles LED0_TOGGLE_6 times. when exits from BACKUP mode, LED0 will toggles LED0_TOGGLE_8 times.
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
The following kit is required for carrying out the test:
The following connections has to be made using wires:
The NVMCTRL_FUSES_EEPROM_SIZE has to be set to 0x00 in the fuse setting of the device to run this test. Atmel Studio can be used to set this fuse (Tools->Device Programming).
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
The following kit is required for carrying out the test:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
The following kit is required for carrying out the test:
There is no special requirement.
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
A timer is used to guarantee the DAC conversions are performed at the correct sample rate, using the Event System module of the device to link the periodic timer output events to the DAC module to trigger new sample conversions.
This application has been tested on following boards:
The device's DAC channel output should be connected to an audio amplifier, speaker, oscilloscope or other similar monitoring equipment so that the generated waveform can be monitored.
On startup the device hardware will be configured, and the example will enter an infinite loop. Each time the board button is pressed, the embedded waveform will be output through the DAC and the board LED will be toggled
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
Input to the AC is provided with the DAC module.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
The following kit is required for carrying out the test:
The following connections has to be made using wires: -SAM D20 Xplained Pro
SAM R21 Xplained Pro
SAM L21 Xplained Pro
SAM L22 Xplained Pro.
SAM C21 Xplained Pro.
SAM R30 Xplained Pro
SAM R34 Xplained Pro
WLR 089 Xplained Pro
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
As many electronic designs evolve rapidly there is a growing need for being able to update products, which have already been shipped or sold. Microcontrollers that support boot loader facilitates updating the application flash section without the need of an external programmer, are of great use in situations where the application has to be updated on the field. The boot loader may use various interfaces like SPI, UART, TWI, Ethernet etc.
This application implements a I2C Slave bootloader for SAM devices.
This application has been tested on following boards:
This bootloader implementation consumes around 8000 bytes (approximately), which is 32 rows of Program Memory space starting from 0x00000000. BOOTPROT fuses on the device can be set to protect first 32 rows of the program memory which are allocated for the BOOT section. So, the end user application should be generated with starting address as 0x00002000.
There are no prerequisites for this implementation
SAM device in SAM Xplained Pro kit is used as the I2C Slave. I2C master should be connected to PIN11 (PA08 - SDA) and PIN12 (PA09 - SCL) on External header 1 (EXT1) of SAM D20/D21 Xplained Pro. I2C master should be connected to PIN11 (PA16 - SDA) and PIN12 (PA17 - SCL) on External header 1 (EXT1) of SAM R21 Xplained Pro. I2C master should be connected to PIN11 (PA22 - SDA) and PIN12 (PA23 - SCL) on External header 1 (EXT1) of SAM D10/D11 Xplained Pro. I2C master should be connected to PIN11 (PB30 - SDA) and PIN12 (PB31 - SCL) on External header 1 (EXT1) of SAM L22 Xplained Pro. I2C master should be connected to PIN11 (PA08 - SDA) and PIN12 (PA09 - SCL) on External header 1 (EXT1) of SAM L21 Xplained Pro. SW0 will be configured as BOOT_LOAD_PIN and LED0 will be used to display the bootloader status. LED0 will be ON when the device is in bootloader mode.
The bootloader is located at the start of the program memory and is executed at each reset/power-on sequence. Initially check the status of a user configurable BOOT_LOAD_PIN.
Initialize the following
Once the programming is completed, enable Watchdog Timer with a timeout period of 256 clock cycles and wait in a loop for Watchdog to reset the device.
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This application demonstrates a runtime XOSC32K (external 32KHz crystal oscillator) failure detector, using hardware timer peripherals and the SAM event system.
A pair of timers are linked together; one with a clock source from the XOSC32K 32.768KHz external clock, and another from the OSC32K 32.768KHz internal RC clock source. Each time the XOSC32K timer reaches a configurable count value, a hardware event resets the second timer using the OSC32K clock source.
If the OSC32K clocked timer reaches a configurable count value before it is reset by the XOSC32K timer, the XOSC32K clock source is considered failed and a callback function is executed. If instead the XOSC32K closed clocked timer resets the OSC32K clocked timer, the oscillator is considered OK and another callback function is executed.
In the example application, the DFLL reference clock is automatically switched between the internal and external 32KHz clock sources depending on the external reference availability.
This application has been tested on following boards:
Connect an oscilloscope to PA28 of the SAM D20/D21 or PB22 of SAMR21 or PA08 of SAM D10/D11 or PA27 of SAML21 or PA14 of SAMR30 Xplained Pro. Run the example application, and press and hold the board button to turn off the external XOSC32K crystal clock source to observe the fail-over to the internal clock source. Releasing the button will re-enable the external crystal.
The board LED will be turned on when the external crystal is used, and will be turned off when the internal RC is used due to a crystal failure detection.
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This application has been tested on following boards:
This application use AIN0 as ADC input channel. When the measured voltage is lower than 0.5V, then the device will start toggling the led pin to signal that the low voltage condition has happened. Connect the PA02(EXT3 pin3) to GND in SAM D20/D21 Xplained Pro to trigger it. Connect the PA06(EXT1 pin3) to GND in SAM R21 Xplained Pro to trigger it. Connect the PA02(EXT1 pin3) to GND in SAM D10/D11 Xplained Pro to trigger it. Connect the PA03(EXT1 pin4) to GND in SAM L21/L22 Xplained Pro to trigger it. Connect the PA03_ADC_DAC_VREF(J701 pin4) to GND in SAM C21 Xplained Pro to trigger it. Connect the PA04(EXT1 pin14) to GND in SAM R30 Xplained Pro to trigger it.
If debugging it is also possible to start a debug session and place a breakpoint in the window callback that will trigger whenever the voltage has gone below the defined threshold.
The application can easily be modified to monitor other voltages by changing the input source and threshold values in the adc_setup function.
The ADC is configured to perform hardware averaging on the measured value, where the ADC will sample the signal 16 times and find the average value in hardware. This smooths out high frequency noise.
To trigger the ADC conversions, the RTC is setup in 32-bit counter mode, clocked by the internal 32kHz oscillator divided by 32, giving a 1kHz input clock. A compare value of 1000 is used to trigger the ADC conversion every second.
The Event system is setup to route the compare match interrupt from the RTC to the ADC, and the ADC is configured to start a new conversion on an event input. The event channel is configured as an asynchronous channel, so no clock is needed for the event channel during sleep.
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
The following kit can be used for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
The following kit is required for carrying out the test:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
This unit test carries out test for three modes of event propagation: Synchronous, Resynchronized & Asynchronous.
The following kits are supported for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
Input to the ADC is provided with the DAC module.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This application demonstrates a simple example to toggle the board LED.
This application has been tested on following boards:
The application uses system timer to generate periodic interrupts, once the interrupt occurs, LED0 will toggle.
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
Counter (CTR)
The following kit is required for carrying out the test:
The following connections has to be made using wires:
3518a2958ff4695a84f9222901de2da524b4520d
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
Overview:
This unit test carries out tests for the AES driver.
This unit test carries out tests for SERCOM USART driver.
This unit test carries out tests for WDT driver.
This unit test carries out tests for the ADC driver.
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
This unit test carries out tests for the EVENTS driver.
This unit test carries out tests for the DAC driver.
This unit test carries out tests for NVM driver.
This unit test carries out tests for TCC driver.
This unit test carries out tests for SERCOM SPI driver.
This unit test carries out tests for the AC driver.
This unit test carries out tests for TC driver.
This unit test carries out tests for the I2C driver.
This unit test carries out tests for the TRNG driver.
This unit test carries out tests for the RTC count driver.
This unit test carries out tests for the RWW EEPROM Emulator service.
This unit test carries out tests for the EEPROM Emulator service.
This unit test carries out tests for the External Interrupt driver.
This unit test carries out tests for the RTC calendor driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the External Interrupt driver.
It consists of test cases for the following functionalities:
This example demonstrates different sleep modes, performance level and power gating feature.
This unit test carries out tests for the EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RWW EEPROM Emulator service.
It consists of test cases for the following functionalities:
This unit test carries out tests for the RTC count driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the TRNG driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the I2C driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple sound player, sourcing a waveform from the device's Non-Volatile Memory and streaming it out of the DAC as an analog waveform.
This unit test carries out tests for the AC driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM SPI driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for TCC driver.
It consists of test cases for the following functionalities:
This application demonstrates a hardware XOSC32K external 32KHz crystal oscillator clock source failure detector, using general purpose hardware peripherals.
This application demonstrates how to configure the ADC in a sleepwalking operation, where the input voltage is measured at a fixed interval, but the device is not woken from sleep until the measured value is below a given threshold; in this application 0.5 Volts.
This unit test carries out tests for NVM driver.
It consists of test cases for the following functionalities:
This application demonstrates the use of the OLED1 Xplained Pro extension board for the SAM Xplained Pro with a Tic-tac-toe game.
This unit test carries out tests for the DAC driver.
DAC conversion has already been tested by quick_start. This test cases consists of the following functionalities:
This unit test carries out tests for the EVENTS driver.
It consists of test cases for the following functionalities:
The Atmel® Software Framework (ASF) is a collection of free embedded software for Atmel microcontroller devices.
It simplifies the usage of Atmel products, providing an abstraction to the hardware and high-value middleware.
ASF is designed to be used for evaluation, prototyping, design and production phases. ASF is integrated in the Atmel Studio IDE with a graphical user interface or available as a standalone package for several commercial and open source compilers.
This document describes the API interfaces to the low level ASF module drivers of the device.
For more information on ASF refer to the online documentation at www.atmel.com/asf.
This unit test carries out tests for the ADC driver.
It consists of test cases for the following functionalities:
This application demonstrates a simple example to toggle the board LED.
This unit test carries out tests for WDT driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for SERCOM USART driver.
It consists of test cases for the following functionalities:
This unit test carries out tests for the AES driver.
It consists of test cases for the following functionalities:
Tests will be performed for AES verious modes.
The following kit is required for carrying out the test:
The following connections has to be made using wires:
To run the test:
This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.
For further information, visit http://www.microchip.com.
1.8.5