Unit tests for EBI driver with SRAM on STK600 Documentation

Introduction

This is the unit test application for the External Bus Interface (EBI) and EBI port/pin configuration. In essence, it tests that the EBI has been correctly set up by employing test cases for:

• data bus faults
• address bus faults
• data integrity issues

Main Files

• unit_tests.c
• common_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h

Device Info

All AVR XMEGA A1 devices can be used. This example has been tested with the following setup:

• STK600 w/ CY7C1019DV-3310VXI (128 kB SRAM)

Description of the unit tests

See the documentation for the individual test functions here for detailed descriptions of the tests.

Dependencies

Relevant module dependencies for this application are:

• Test Suite Framework
• External Bus Interface (EBI) and EBI port/pin configuration
• Common EBI test functions

Compilation info

This software was written for the GNU GCC and IAR for AVR. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.