at30ts_example1.c File Reference

AT30TS Temperature Sensor driver example.

Copyright (c) 2015-2018 Microchip Technology Inc. and its subsidiaries.

#include <asf.h>
#include <stdio.h>
#include <conf_example.h>

Functions
int	main (void)
	Main entry of example application. More...
void	test_fail_indication (void)
	This function is used to indicate a test failure. More...

int main

(

void

)

Main entry of example application.

References AT30TS7_POL_ACTIVE_LOW, AT30TS7_RES12, AT30TS_POL, attach_device(), board_init(), twi_options_t::chip, delay_ms, gfx_mono_draw_string(), gfx_mono_generic_draw_filled_rect(), gfx_mono_init, GFX_PIXEL_CLR, ioport_configure_pin(), IOPORT_DIR_INPUT, IOPORT_DIR_OUTPUT, ioport_set_pin_high(), ioport_set_pin_low(), PATTERN_TEST_LENGTH, pos, read_config(), read_nvconfig(), read_nvthigh(), read_nvtlow(), read_tcrit(), read_temperature(), read_temperature_high(), read_temperature_low(), set_config_option(), twi_options_t::speed, sysclk_init, sysfont, sensor_data_t::temperature, test_fail_indication(), test_pattern, ts75_copy_nonvol_vol_register(), ts75_copy_vol_nonvol_register(), ts_read_eeprom(), ts_write_memory(), twi_master_setup(), TWI_SPEED, TWI_SUCCESS, sensor_data_t::value, write_config(), write_tcrit(), write_temperature_high(), and write_temperature_low().

void test_fail_indication

(

void

)

This function is used to indicate a test failure.

References delay_ms, ioport_set_pin_high(), and ioport_set_pin_low().

Referenced by main().