Unit test functions for mt48LC16m16a2tg7 SDRAM component.
Copyright (c) 2014-2018 Microchip Technology Inc. and its subsidiaries.
Data Structures | |
struct | ebi_test_params |
EBI test parameters. More... | |
Functions | |
void | run_data_integrity_test (const struct test_case *test) |
Test the data integrity. More... | |
void run_data_integrity_test | ( | const struct test_case * | test | ) |
Test the data integrity.
Tests the integrity of the entire SDRAM by filling it a sequence of incrementing 32-bit values and then verifying its content.
test | Current test case. |
References ebi_test_params::base, params, ebi_test_params::size, test_assert_true, and test_get_data().
Referenced by main().