NAND Flash component unit Test for SAM4S Documentation

Introduction

This is the unit test application for the NAND Flash component. It consists of test cases for the following functionality:

• read flash ID
• raw data read/write
• data read/write with software ecc

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h

Device Info

SAM3S,U,X devices can be used. This example has been tested with the following setup:

• sam3s4c_sam3s_ek
• sam3sd8c_sam3s_ek2
• sam3u4e_sam3u_ek
• sam3x8h_sam3x_ek

Compilation info

This software was written for the GNU GCC and IAR for ARM. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.
Support and FAQ: https://www.microchip.com/support/