IOPORT service unit tests on ATMEGA256RFR2 XPLAINED PRO Documentation

Introduction

This is the unit test for the IOPORT service. The IO Pin is tested by setting high and low and read back using another IO Pin by shorting the pins.

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h

Device Info

This example has been tested with the following setup(s):

• atmega128rfa1_stk600 and atmega256rfr2_xplained_pro

Description of the unit tests

See the documentation for the individual unit test functions here for detailed descriptions of the tests.

Dependencies

This example depends directly on the following modules:

• Test Suite Framework
• USART module (USART)
• megarf_ioport_group

Compilation info

This software was written for the GNU GCC and IAR for AVR. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.