SAM C21 Xplained Pro test configuration.
Copyright (c) 2015-2018 Microchip Technology Inc. and its subsidiaries.
Macros | |
#define | CONF_CAPTURE_CHAN_0 0 |
#define | CONF_CAPTURE_CHAN_1 1 |
#define | CONF_EIC_CHAN 4 |
#define | CONF_EIC_MUX MUX_PA20A_EIC_EXTINT4 |
#define | CONF_EIC_PIN PIN_PA20A_EIC_EXTINT4 |
#define | CONF_EVENT_GENERATOR_ID EVSYS_ID_GEN_EIC_EXTINT_4 |
#define | CONF_EVENT_USED_ID EVSYS_ID_USER_TCC1_EV_1 |
#define | CONF_EVENT_USER_ID_FAULTn EVSYS_ID_USER_TCC0_MC_0 |
#define | CONF_EVENT_USER_ID_FAULTx EVSYS_ID_USER_TCC0_EV_0 |
#define | CONF_STDIO_BAUDRATE 38400 |
#define | CONF_STDIO_MUX_SETTING EDBG_CDC_SERCOM_MUX_SETTING |
#define | CONF_STDIO_PINMUX_PAD0 EDBG_CDC_SERCOM_PINMUX_PAD0 |
#define | CONF_STDIO_PINMUX_PAD1 EDBG_CDC_SERCOM_PINMUX_PAD1 |
#define | CONF_STDIO_PINMUX_PAD2 EDBG_CDC_SERCOM_PINMUX_PAD2 |
#define | CONF_STDIO_PINMUX_PAD3 EDBG_CDC_SERCOM_PINMUX_PAD3 |
#define | CONF_STDIO_USART EDBG_CDC_MODULE |
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#define | CONF_TEST_PIN_MUX MUX_PA08E_TCC0_WO0 |
#define | CONF_TEST_PIN_OUT PIN_PA08E_TCC0_WO0 |
#define | CONF_TEST_TCC0 TCC0 |
#define | CONF_TEST_TCC1 TCC1 |
#define | CONF_TEST_TOLERANCE 10 |
#define CONF_CAPTURE_CHAN_0 0 |
Referenced by run_capture_and_compare_test().
#define CONF_CAPTURE_CHAN_1 1 |
Referenced by run_capture_and_compare_test().
#define CONF_EIC_CHAN 4 |
Referenced by run_capture_and_compare_test(), run_faultn_test(), and run_faultx_test().
#define CONF_EIC_MUX MUX_PA20A_EIC_EXTINT4 |
Referenced by run_capture_and_compare_test(), run_faultn_test(), and run_faultx_test().
#define CONF_EIC_PIN PIN_PA20A_EIC_EXTINT4 |
Referenced by run_capture_and_compare_test(), run_faultn_test(), and run_faultx_test().
#define CONF_EVENT_GENERATOR_ID EVSYS_ID_GEN_EIC_EXTINT_4 |
Referenced by run_capture_and_compare_test(), run_faultn_test(), and run_faultx_test().
#define CONF_EVENT_USED_ID EVSYS_ID_USER_TCC1_EV_1 |
Referenced by run_capture_and_compare_test().
#define CONF_EVENT_USER_ID_FAULTn EVSYS_ID_USER_TCC0_MC_0 |
Referenced by run_faultn_test().
#define CONF_EVENT_USER_ID_FAULTx EVSYS_ID_USER_TCC0_EV_0 |
Referenced by run_faultx_test().
#define CONF_STDIO_BAUDRATE 38400 |
Referenced by cdc_uart_init().
#define CONF_STDIO_MUX_SETTING EDBG_CDC_SERCOM_MUX_SETTING |
Referenced by cdc_uart_init().
#define CONF_STDIO_PINMUX_PAD0 EDBG_CDC_SERCOM_PINMUX_PAD0 |
Referenced by cdc_uart_init().
#define CONF_STDIO_PINMUX_PAD1 EDBG_CDC_SERCOM_PINMUX_PAD1 |
Referenced by cdc_uart_init().
#define CONF_STDIO_PINMUX_PAD2 EDBG_CDC_SERCOM_PINMUX_PAD2 |
Referenced by cdc_uart_init().
#define CONF_STDIO_PINMUX_PAD3 EDBG_CDC_SERCOM_PINMUX_PAD3 |
Referenced by cdc_uart_init().
#define CONF_STDIO_USART EDBG_CDC_MODULE |
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Referenced by cdc_uart_init().
#define CONF_TEST_PIN_MUX MUX_PA08E_TCC0_WO0 |
Referenced by run_capture_and_compare_test().
#define CONF_TEST_PIN_OUT PIN_PA08E_TCC0_WO0 |
Referenced by run_capture_and_compare_test(), run_faultn_test(), and run_faultx_test().
#define CONF_TEST_TCC0 TCC0 |
#define CONF_TEST_TCC1 TCC1 |
Referenced by run_capture_and_compare_test(), and run_init_test().
#define CONF_TEST_TOLERANCE 10 |
Referenced by run_capture_and_compare_test().