/components/memory/serial_flash/at25dfx/unit_tests/unit_tests.c File Reference

Unit tests for AT25DFx driver.

Copyright (c) 2013-2018 Microchip Technology Inc. and its subsidiaries.

#include <asf.h>
#include <conf_test.h>
#include <conf_at25dfx.h>

Macros
#define	TEST_BUFFER_SIZE   16
#define	TEST_ERASE_VALUE   0xff
#define	TEST_FLASH_SIZE   (1024 * 1024UL)
#define	TEST_PAGE_SIZE   256

Functions
static void	cdc_uart_init (void)
int	main (void)
static void	test_at25dfx_init (void)
Tests
static void	run_check_presence_test (const struct test_case *test)
static void	run_read_write_buffer_test (const struct test_case *test)
static void	run_erase_test (const struct test_case *test)
static void	run_erase_block_test (const struct test_case *test)
static void	run_global_sector_protect_test (const struct test_case *test)
static void	run_set_get_sector_protect_test (const struct test_case *test)
static void	run_sleep_wake_test (const struct test_case *test)

Variables
static struct at25dfx_chip_module	at25dfx_chip
static struct at25dfx_chip_module	at25dfx_dummy
static at25dfx_spi_module_t	at25dfx_spi
static struct usart_module	cdc_uart_module
static uint8_t	test_rx_buffer [TEST_BUFFER_SIZE]
static uint8_t	test_tx_buffer [TEST_BUFFER_SIZE]

#define TEST_BUFFER_SIZE   16

Referenced by run_read_write_buffer_test().

#define TEST_ERASE_VALUE   0xff

Referenced by run_erase_block_test(), run_erase_test(), run_global_sector_protect_test(), and run_read_write_buffer_test().

#define TEST_FLASH_SIZE   (1024 * 1024UL)

Referenced by run_erase_block_test(), run_erase_test(), run_global_sector_protect_test(), run_read_write_buffer_test(), and run_set_get_sector_protect_test().

#define TEST_PAGE_SIZE   256

Referenced by run_read_write_buffer_test().

static void cdc_uart_init ( void  )

static

References usart_config::baudrate, cdc_uart_module, CONF_STDIO_BAUDRATE, CONF_STDIO_MUX_SETTING, CONF_STDIO_PINMUX_PAD0, CONF_STDIO_PINMUX_PAD1, CONF_STDIO_PINMUX_PAD2, CONF_STDIO_PINMUX_PAD3, CONF_STDIO_USART_MODULE, usart_config::mux_setting, usart_config::pinmux_pad0, usart_config::pinmux_pad1, usart_config::pinmux_pad2, usart_config::pinmux_pad3, usart_enable(), and usart_get_config_defaults().

Referenced by main().

int main

(

void

)

References cdc_uart_init(), DEFINE_TEST_ARRAY, DEFINE_TEST_CASE, DEFINE_TEST_SUITE, NULL, run_check_presence_test(), run_erase_block_test(), run_erase_test(), run_global_sector_protect_test(), run_read_write_buffer_test(), run_set_get_sector_protect_test(), run_sleep_wake_test(), system_init(), test_at25dfx_init(), and test_suite_run().

static void run_check_presence_test ( const struct test_case *  test )

static

References at25dfx_chip, at25dfx_chip_check_presence(), at25dfx_dummy, status, STATUS_ERR_NOT_FOUND, STATUS_OK, and test_assert_true.

Referenced by main().

static void run_erase_block_test ( const struct test_case *  test )

static

References AT25DFX_BLOCK_SIZE_32KB, AT25DFX_BLOCK_SIZE_4KB, AT25DFX_BLOCK_SIZE_64KB, at25dfx_chip, at25dfx_chip_erase_block(), at25dfx_chip_read_buffer(), at25dfx_chip_set_global_sector_protect(), at25dfx_chip_write_buffer(), status, STATUS_ERR_INVALID_ARG, test_assert_true, TEST_ERASE_VALUE, TEST_FLASH_SIZE, test_rx_buffer, and test_tx_buffer.

Referenced by main().

static void run_erase_test ( const struct test_case *  test )

static

References at25dfx_chip, at25dfx_chip_erase(), at25dfx_chip_read_buffer(), at25dfx_chip_set_global_sector_protect(), at25dfx_chip_write_buffer(), status, STATUS_OK, test_assert_true, TEST_ERASE_VALUE, TEST_FLASH_SIZE, test_rx_buffer, and test_tx_buffer.

Referenced by main().

static void run_global_sector_protect_test ( const struct test_case *  test )

static

References at25dfx_chip, at25dfx_chip_erase(), at25dfx_chip_read_buffer(), at25dfx_chip_set_global_sector_protect(), at25dfx_chip_write_buffer(), status, STATUS_OK, test_assert_true, TEST_ERASE_VALUE, TEST_FLASH_SIZE, test_rx_buffer, and test_tx_buffer.

Referenced by main().

static void run_read_write_buffer_test ( const struct test_case *  test )

static

References at25dfx_chip, at25dfx_chip_erase(), at25dfx_chip_read_buffer(), at25dfx_chip_set_global_sector_protect(), at25dfx_chip_write_buffer(), status, STATUS_ERR_INVALID_ARG, STATUS_OK, test_assert_true, TEST_BUFFER_SIZE, TEST_ERASE_VALUE, TEST_FLASH_SIZE, TEST_PAGE_SIZE, test_rx_buffer, and test_tx_buffer.

Referenced by main().

static void run_set_get_sector_protect_test ( const struct test_case *  test )

static

References at25dfx_chip, at25dfx_chip_get_sector_protect(), at25dfx_chip_set_global_sector_protect(), at25dfx_chip_set_sector_protect(), status, STATUS_ERR_INVALID_ARG, STATUS_OK, test_assert_true, and TEST_FLASH_SIZE.

Referenced by main().

static void run_sleep_wake_test ( const struct test_case *  test )

static

References AT25DFX_BLOCK_SIZE_4KB, at25dfx_chip, at25dfx_chip_erase_block(), at25dfx_chip_read_buffer(), at25dfx_chip_set_global_sector_protect(), at25dfx_chip_sleep(), at25dfx_chip_wake(), at25dfx_chip_write_buffer(), test_assert_true, test_rx_buffer, and test_tx_buffer.

Referenced by main().

static void test_at25dfx_init ( void  )

static

References at25dfx_chip, at25dfx_chip_init(), at25dfx_dummy, at25dfx_spi_get_config_defaults(), at25dfx_spi_master_vec_get_config_defaults(), spi_master_vec_config::baudrate, spi_master_config::baudrate, at25dfx_chip_config::cs_pin, spi_config::master, spi_config::mode_specific, spi_config::mux_setting, spi_config::pinmux_pad0, spi_config::pinmux_pad1, spi_config::pinmux_pad2, spi_config::pinmux_pad3, spi_enable(), spi_init(), spi_master_vec_enable(), spi_master_vec_init(), and at25dfx_chip_config::type.

Referenced by main().

struct at25dfx_chip_module at25dfx_chip

static

struct at25dfx_chip_module at25dfx_dummy

static

Referenced by run_check_presence_test(), and test_at25dfx_init().

at25dfx_spi_module_t at25dfx_spi

static

struct usart_module cdc_uart_module

static

uint8_t test_rx_buffer[TEST_BUFFER_SIZE]

static

Referenced by run_erase_block_test(), run_erase_test(), run_global_sector_protect_test(), run_read_write_buffer_test(), and run_sleep_wake_test().

uint8_t test_tx_buffer[TEST_BUFFER_SIZE]

static

Initial value:

= {
        0x12, 0x34, 0x56, 0x78,
        0x9a, 0xbc, 0xde, 0xf0,
        0x21, 0x43, 0x65, 0x87,
        0xa9, 0xcb, 0xed, 0x0f,
    }

Referenced by run_erase_block_test(), run_erase_test(), run_global_sector_protect_test(), run_read_write_buffer_test(), and run_sleep_wake_test().