sam/drivers/afec/unit_tests/unit_tests.c File Reference

Unit tests for AFEC driver.

Copyright (c) 2013-2018 Microchip Technology Inc. and its subsidiaries.

#include <board.h>
#include <sysclk.h>
#include <delay.h>
#include "afec.h"
#include "pmc.h"
#include "tc.h"
#include "ioport.h"
#include <string.h>
#include <unit_test/suite.h>
#include <stdio_serial.h>
#include <conf_test.h>
#include <conf_board.h>

Functions
static void	afec_set_comp_flag (void)
	Callback function for AFEC enter compasion window interrupt. More...
static void	afec_set_data_ready_flag (void)
	Callback function for AFEC conversion data is ready interrupt. More...
static void	configure_tc_trigger (void)
	Configure to trigger AFEC by TIOA output of timer. More...
int	main (void)
	Run AFEC driver unit tests. More...
static void	run_afec_comp_test (const struct test_case *test)
	Test AFEC in comparsion window mode. More...
static void	run_afec_tc_trig_test (const struct test_case *test)
	Test AFEC in TC trigger mode, which also tests interrupt driven conversions. More...

Variables
volatile bool	is_comp_event_flag = false
	Enter comparison window flag. More...
volatile bool	is_data_ready = false
	Conversion data is ready flag. More...

static void afec_set_comp_flag ( void  )

static

Callback function for AFEC enter compasion window interrupt.

References afec_disable_interrupt(), and is_comp_event_flag.

Referenced by run_afec_comp_test().

static void afec_set_data_ready_flag ( void  )

static

Callback function for AFEC conversion data is ready interrupt.

References afec_disable_interrupt(), is_data_ready, and tc_stop().

Referenced by run_afec_tc_trig_test().

static void configure_tc_trigger ( void  )

static

Configure to trigger AFEC by TIOA output of timer.

References afec_set_trigger(), AFEC_TRIG_TIO_CH_0, ioport_disable_pin(), ioport_set_pin_mode(), pmc_enable_periph_clk(), sysclk_get_cpu_hz(), tc_find_mck_divisor(), tc_init(), and tc_start().

Referenced by run_afec_tc_trig_test().

int main

(

void

)

Run AFEC driver unit tests.

References afec_channel_enable(), afec_channel_set_analog_offset(), afec_enable(), afec_get_config_defaults(), afec_init(), uart_rs232_options::baudrate, board_init(), DEFINE_TEST_ARRAY, DEFINE_TEST_CASE, DEFINE_TEST_SUITE, NULL, run_afec_comp_test(), run_afec_tc_trig_test(), stdio_serial_init(), sysclk_enable_peripheral_clock(), sysclk_init(), test_suite_run(), and usart_serial_options.

static void run_afec_comp_test ( const struct test_case *  test )

static

Test AFEC in comparsion window mode.

Parameters

test	Current test case.

References AFEC_CMP_MODE_2, afec_set_callback(), afec_set_comp_flag(), afec_set_comparison_mode(), afec_set_comparison_window(), afec_set_trigger(), afec_start_software_conversion(), AFEC_TRIG_SW, delay_ms, is_comp_event_flag, and test_assert_true.

Referenced by main().

static void run_afec_tc_trig_test ( const struct test_case *  test )

static

Test AFEC in TC trigger mode, which also tests interrupt driven conversions.

Parameters

test	Current test case.

References afec_set_callback(), afec_set_data_ready_flag(), configure_tc_trigger(), delay_ms, is_data_ready, and test_assert_true.

Referenced by main().

volatile bool is_comp_event_flag = false

Enter comparison window flag.

Referenced by afec_set_comp_flag(), and run_afec_comp_test().

volatile bool is_data_ready = false

Conversion data is ready flag.

Referenced by afec_set_data_ready_flag(), and run_afec_tc_trig_test().