sam/services/flash_efc/unit_tests/unit_tests.c File Reference

Unit tests for flash efc driver.

Copyright (c) 2011-2018 Microchip Technology Inc. and its subsidiaries.

#include <board.h>
#include <sysclk.h>
#include <flash_efc.h>
#include <string.h>
#include <unit_test/suite.h>
#include <stdio_serial.h>
#include <conf_test.h>
#include <conf_board.h>

Functions
int	main (void)
	Run flash efc driver unit tests. More...
static void	run_flash_configure_test (const struct test_case *test)
	Test flash configure functions. More...
static void	run_flash_device_id_test (const struct test_case *test)
	Test flash device id interface. More...
static void	run_flash_gpnvm_test (const struct test_case *test)
	Test flash GPNVM setting. More...
static void	run_flash_information_test (const struct test_case *test)
	Test get flash information interfaces. More...
static void	run_flash_lock_test (const struct test_case *test)
	Test flash lock setting. More...
static void	run_flash_write_test (const struct test_case *test)
	Test flash writing. More...

int main

(

void

)

Run flash efc driver unit tests.

References uart_rs232_options::baudrate, board_init(), DEFINE_TEST_ARRAY, DEFINE_TEST_CASE, DEFINE_TEST_SUITE, NULL, run_flash_configure_test(), run_flash_device_id_test(), run_flash_gpnvm_test(), run_flash_information_test(), run_flash_lock_test(), run_flash_write_test(), stdio_serial_init(), sysclk_enable_peripheral_clock(), sysclk_init(), test_suite_run(), and usart_serial_options.

static void run_flash_configure_test ( const struct test_case *  test )

static

Test flash configure functions.

Note

This test gets the default wait state first, and then it will initialize the flash again and set/adaptively set the wait state.

Parameters

test	Current test case.

References FLASH_ACCESS_MODE_128, flash_get_wait_state(), flash_init(), flash_set_wait_state(), flash_set_wait_state_adaptively(), sysclk_get_cpu_hz(), and test_assert_true.

Referenced by main().

static void run_flash_device_id_test ( const struct test_case *  test )

static

Test flash device id interface.

This test gets the device id of the flash.

Parameters

test	Current test case.

References FLASH_RC_OK, flash_read_unique_id(), and test_assert_true.

Referenced by main().

static void run_flash_gpnvm_test ( const struct test_case *  test )

static

Test flash GPNVM setting.

This test gets the gpnvm 1 status and then sets and clears the status.

Parameters

test	Current test case.

References flash_clear_gpnvm(), flash_is_gpnvm_set(), FLASH_RC_NO, FLASH_RC_YES, flash_set_gpnvm(), and test_assert_true.

Referenced by main().

static void run_flash_information_test ( const struct test_case *  test )

static

Test get flash information interfaces.

Note

This test gets the descriptor first, and then it will read out the page count, page count per region and region count number.

Parameters

test	Current test case.

References flash_get_descriptor(), flash_get_page_count(), flash_get_page_count_per_region(), flash_get_region_count(), and test_assert_true.

Referenced by main().

static void run_flash_lock_test ( const struct test_case *  test )

static

Test flash lock setting.

Note

This test gets the lock status of the whole flash space and unlocks/locks the test page for validation.

Parameters

test	Current test case.

References flash_is_locked(), flash_lock(), flash_unlock(), flash_write(), and test_assert_true.

Referenced by main().

static void run_flash_write_test ( const struct test_case *  test )

static

Test flash writing.

This test tests the flash writing function in the test page of the flash.

Parameters

test	Current test case.

References flash_unlock(), flash_write(), and test_assert_true.

Referenced by main().