drivers/dac/unit_test/unit_test.c File Reference

SAM DAC Unit Test.

Copyright (c) 2015-2018 Microchip Technology Inc. and its subsidiaries.

#include <asf.h>
#include <stdio_serial.h>
#include <string.h>
#include "conf_test.h"

Functions
static void	cdc_uart_init (void)
	Initialize the USART for unit test. More...
void	configure_event_resource (void)
	event source for DAC conversion More...
void	configure_rtc_count (void)
	rtc for event generator More...
int	main (void)
	Run DAC unit tests. More...
static void	run_dac_event_control_test (const struct test_case *test)
	Test for DAC conversion driven by events in polled mode. More...
static void	run_dac_init_test (const struct test_case *test)
	Initialize the DAC for unit test. More...

Variables
struct usart_module	cdc_uart_module
struct dac_module	dac_instance
struct events_resource	event_dac
struct rtc_module	rtc_instance
	[rtc_module_instance] More...

static void cdc_uart_init ( void  )

static

Initialize the USART for unit test.

Initializes the SERCOM USART (SERCOM4) used for sending the unit test status to the computer via the EDBG CDC gateway.

References usart_config::baudrate, cdc_uart_module, CONF_STDIO_BAUDRATE, CONF_STDIO_MUX_SETTING, CONF_STDIO_PINMUX_PAD0, CONF_STDIO_PINMUX_PAD1, CONF_STDIO_PINMUX_PAD2, CONF_STDIO_PINMUX_PAD3, usart_config::mux_setting, usart_config::pinmux_pad0, usart_config::pinmux_pad1, usart_config::pinmux_pad2, usart_config::pinmux_pad3, usart_enable(), and usart_get_config_defaults().

Referenced by main().

void configure_event_resource

(

void

)

event source for DAC conversion

set rtc overflow as the event generator for DAC conversion

void configure_rtc_count

(

void

)

rtc for event generator

set rtc clock prescaler and mode to generate overflow events

int main

(

void

)

Run DAC unit tests.

Initializes the system and serial output, then sets up the DAC unit test suite and runs it.

References cdc_uart_init(), DEFINE_TEST_ARRAY, DEFINE_TEST_CASE, DEFINE_TEST_SUITE, delay_init(), NULL, run_dac_event_control_test(), run_dac_init_test(), system_init(), and test_suite_run().

static void run_dac_event_control_test ( const struct test_case *  test )

static

Test for DAC conversion driven by events in polled mode.

after the first event, dac should enter channel buffer empty status. after the second event, dac should enter channel buffer underrun status.

References configure_event_resource(), configure_rtc_count(), dac_chan_write(), DAC_CHANNEL_0, dac_get_status(), dac_instance, DAC_STATUS_CHANNEL_0_EMPTY, DAC_STATUS_CHANNEL_0_UNDERRUN, delay_ms, rtc_count_set_period(), rtc_instance, STATUS_OK, and test_assert_true.

Referenced by main().

static void run_dac_init_test ( const struct test_case *  test )

static

Initialize the DAC for unit test.

Initializes the DAC module to accept events to start conversion

References dac_chan_enable(), dac_chan_get_config_defaults(), dac_chan_set_config(), DAC_CHANNEL_0, dac_enable(), dac_enable_events(), dac_get_config_defaults(), dac_init(), dac_instance, dac_events::on_event_chan0_start_conversion, STATUS_ERR_IO, STATUS_OK, and test_assert_true.

Referenced by main().

struct usart_module cdc_uart_module

struct dac_module dac_instance

struct events_resource event_dac

struct rtc_module rtc_instance

[rtc_module_instance]

[rtc_module_instance]

[rtc_module_inst]