example1/example.c File Reference

SD/MMC card example.

Copyright (c) 2014-2018 Microchip Technology Inc. and its subsidiaries.

#include <asf.h>
#include "conf_example.h"
#include <string.h>
#include "time_tick.h"

Functions
static void	cdc_uart_init (void)
	Initialize the USART for output. More...
int	main (void)
	Application entry point. More...
static void	main_display_info_card (uint8_t slot)
	Display basic information of the card. More...
static void	main_test_memory (uint8_t slot)
	Card R/W tests. More...

Variables
struct usart_module	cdc_uart_module
	Structure for UART module connected to EDBG (used for unit test output) More...

Read/write access configurations
#define	TEST_MEM_START_OFFSET   (1024lu * 1024lu * 4lu)
	Offset before the end of memory card to start the test. More...
#define	TEST_MEM_AREA_SIZE   (1024lu * 128lu)
	Memory area size dedicated for the read/write test. More...
#define	TEST_MEM_ACCESS_SIZE   (8lu * SD_MMC_BLOCK_SIZE)
	Size of each read or write access. More...
#define	TEST_FILL_VALUE_U32   (0x5500AAFFU)
	The value used to generate test data. More...
static COMPILER_WORD_ALIGNED uint8_t	buf_test [TEST_MEM_ACCESS_SIZE]
	Buffer used by read/write tests. More...

#define TEST_FILL_VALUE_U32   (0x5500AAFFU)

The value used to generate test data.

Referenced by main_test_memory().

#define TEST_MEM_ACCESS_SIZE   (8lu * SD_MMC_BLOCK_SIZE)

Size of each read or write access.

Increasing this number can get higher R/W performance.

Referenced by main_test_memory().

#define TEST_MEM_AREA_SIZE   (1024lu * 128lu)

Memory area size dedicated for the read/write test.

Referenced by main_test_memory().

#define TEST_MEM_START_OFFSET   (1024lu * 1024lu * 4lu)

Offset before the end of memory card to start the test.

Referenced by main_test_memory().

static void cdc_uart_init ( void  )

static

Initialize the USART for output.

Initializes the SERCOM USART used for sending the output to the computer via the EDBG CDC gateway.

References usart_config::baudrate, cdc_uart_module, CONF_STDIO_BAUDRATE, CONF_STDIO_MUX_SETTING, CONF_STDIO_PINMUX_PAD0, CONF_STDIO_PINMUX_PAD1, CONF_STDIO_PINMUX_PAD2, CONF_STDIO_PINMUX_PAD3, usart_config::mux_setting, usart_config::pinmux_pad0, usart_config::pinmux_pad1, usart_config::pinmux_pad2, usart_config::pinmux_pad3, usart_enable(), and usart_get_config_defaults().

Referenced by main().

int main

(

void

)

Application entry point.

Returns

Unused (ANSI-C compatibility).

References CARD_TYPE_MMC, CARD_TYPE_SD, cdc_uart_init(), cpu_irq_enable(), delay_init(), irq_initialize_vectors, main_display_info_card(), main_test_memory(), sd_mmc_check(), SD_MMC_ERR_NO_CARD, sd_mmc_get_type(), sd_mmc_init(), SD_MMC_INIT_ONGOING, sd_mmc_nb_slot(), SD_MMC_OK, system_init(), and time_tick_init().

static void main_display_info_card ( uint8_t  slot )

static

Display basic information of the card.

Note

This function should be called only after the card has been initialized successfully.

Parameters

slot	SD/MMC slot to test

References CARD_TYPE_HC, CARD_TYPE_MMC, CARD_TYPE_SD, CARD_TYPE_SD_COMBO, CARD_TYPE_UNKNOWN, sd_mmc_get_capacity(), and sd_mmc_get_type().

Referenced by main().

static void main_test_memory ( uint8_t  slot )

static

Card R/W tests.

Parameters

slot	SD/MMC slot to test

References buf_test, i, SD_MMC_BLOCK_SIZE, sd_mmc_get_capacity(), sd_mmc_init_read_blocks(), sd_mmc_init_write_blocks(), sd_mmc_is_write_protected(), SD_MMC_OK, sd_mmc_start_read_blocks(), sd_mmc_start_write_blocks(), sd_mmc_wait_end_of_read_blocks(), sd_mmc_wait_end_of_write_blocks(), TEST_FILL_VALUE_U32, TEST_MEM_ACCESS_SIZE, TEST_MEM_AREA_SIZE, TEST_MEM_START_OFFSET, time_tick_calc_delay(), and time_tick_get().

Referenced by main().

COMPILER_WORD_ALIGNED uint8_t buf_test[TEST_MEM_ACCESS_SIZE]

static

Buffer used by read/write tests.

Referenced by main_test_memory().

struct usart_module cdc_uart_module

Structure for UART module connected to EDBG (used for unit test output)