Unit Tests

Introduction

This documentation has been automatically generated, and documents the source code found in the Microchip Advanced Software Framework (ASF).

Unit-tests

	AT45DBX DataFlash unit tests for STK600-RCUC3L4
	Basic clock service unit tests for UC3L-EK
	Calendar driver unit tests on STK600-RCUC3L4
	Calendar driver unit tests on UC3-L0 Xplained
	MEMBAG unit tests for UC3-L0 Xplained
	Sensor Platform unit tests for UC3-L0 Xplained
	USB Device CDC unit tests for stk600-rcuc3l4
	USB Device HID Mouse unit tests for stk600-rcuc3l4
	USB Device HID Mouse unit tests for stk600-rcuc3l4