DES driver unit tests on XMEGA A1 Xplained Documentation

Introduction

This is the unit test application for the nvm_group. It consists of test cases for the following functionality:

• Encryption/decryption round test with DES/3DES
• Pre-calculated value tests for DES/3DES encryption/decryption
• Pre-calculated value tests for DES/3DES CBC encryption/decryption

Main Files

• unit_tests.c
• conf_test.h
• conf_board.h
• conf_clock.h
• conf_usart_serial.h
• conf_sleepmgr.h

Device Info

All AVR XMEGA devices can be used. This example has been tested with the following setup:

• Xplained

Description of the unit tests

See the documentation for the individual unit test functions here for detailed descriptions of the tests.

Dependencies

This example depends directly on the following modules:

• Test Suite Framework
• Data Encryption Standard (DES)

Compilation info

This software was written for the GNU GCC and IAR for AVR. Other compilers may or may not work.

Contact Information

For further information, visit Microchip.