unit_tests.c File Reference

Unit tests for AT25DFx driver.

Copyright (c) 2012-2018 Microchip Technology Inc. and its subsidiaries.

#include <stdint.h>
#include <stdbool.h>
#include <board.h>
#include <sysclk.h>
#include <string.h>
#include <unit_test/suite.h>
#include <stdio_serial.h>
#include <conf_clock.h>
#include <conf_board.h>
#include <conf_test.h>
#include <at25dfx.h>
#include <conf_at25dfx.h>

Macros
#define	TEST_PROTECT_ADDRESS   0x200

Functions
int	main (void)
	Run AT25DFx driver unit tests. More...
static void	run_test_at25dfx_data_access (const struct test_case *test)
	Test data read, write and erase API functions. More...
static void	run_test_at25dfx_init (const struct test_case *test)
	Test AT25DFx initialization procedure. More...
static void	run_test_at25dfx_protect (const struct test_case *test)
	Test AT25DFx protect functions. More...

Variables
static uint8_t	data_buff [AT25DFX_UNIT_TEST_PAGE_SIZE]

#define TEST_PROTECT_ADDRESS   0x200

Referenced by run_test_at25dfx_protect().

int main

(

void

)

Run AT25DFx driver unit tests.

References uart_rs232_options::baudrate, board_init(), CONF_TEST_BAUDRATE, CONF_TEST_CHARLENGTH, CONF_TEST_PARITY, CONF_TEST_STOPBITS, CONF_TEST_USART, DEFINE_TEST_ARRAY, DEFINE_TEST_CASE, DEFINE_TEST_SUITE, run_test_at25dfx_data_access(), run_test_at25dfx_init(), run_test_at25dfx_protect(), stdio_serial_init(), sysclk_init(), and test_suite_run().

static void run_test_at25dfx_data_access ( const struct test_case *  test )

static

Test data read, write and erase API functions.

This test calls the data chip erase, read, write and block erase API functions.

Parameters

test	Current test case.

References AT25_ERROR, AT25_SUCCESS, AT25_TYPE_UNPROTECT, at25dfx_erase_block(), at25dfx_protect_chip(), at25dfx_read(), AT25DFX_UNIT_TEST_BLOCK_ADDR, AT25DFX_UNIT_TEST_BLOCK_SIZE, AT25DFX_UNIT_TEST_PAGE_SIZE, at25dfx_write(), data_buff, and test_assert_true.

Referenced by main().

static void run_test_at25dfx_init ( const struct test_case *  test )

static

Test AT25DFx initialization procedure.

This test calls the initialization function and checks the SerialFlash.

Parameters

test	Current test case.

References AT25_SUCCESS, at25dfx_initialize(), at25dfx_mem_check(), AT25DFX_MEM_ID, at25dfx_set_mem_active(), and test_assert_true.

Referenced by main().

static void run_test_at25dfx_protect ( const struct test_case *  test )

static

Test AT25DFx protect functions.

This test calls the SerialFlash protect functions.

Parameters

test	Current test case.

References AT25_SECTOR_PROTECTED, AT25_SECTOR_UNPROTECTED, AT25_STATUS_SWP, AT25_STATUS_SWP_PROTNONE, AT25_TYPE_PROTECT, AT25_TYPE_UNPROTECT, at25dfx_protect_chip(), at25dfx_protect_sector(), at25dfx_read_sector_protect_status(), at25dfx_read_status(), test_assert_true, and TEST_PROTECT_ADDRESS.

Referenced by main().

uint8_t data_buff[AT25DFX_UNIT_TEST_PAGE_SIZE]

static

Referenced by run_test_at25dfx_data_access().